Sekyere, Michael
31  Ergebnisse:
Personensuche X
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2

Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-A..:

, In: 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS),
 
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3

A Power Supply Rejection Based Approach for Robust Defect D..:

, In: 2023 IEEE East-West Design & Test Symposium (EWDTS),
 
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4

Graph Theory Based Defect Simulation Framework for Analog a..:

, In: 2023 IEEE East-West Design & Test Symposium (EWDTS),
 
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5

Small Area, High Accuracy Sub-Radix Resistive Current Mode ..:

, In: 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS),
 
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6

Digital Assisted Defect Detection Methods for Analog and Mi..:

, In: 2023 IEEE East-West Design & Test Symposium (EWDTS),
 
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7

Low-cost defect simulation framework for analog and mixed s..:

Saikiran, Marampally ; Sekyere, Michael ; Ganji, Mona..
Analog Integrated Circuits and Signal Processing.  117 (2023)  1-3 - p. 73-94 , 2023
 
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8

All Digital Low-Cost Built-in Defect Testing Strategy for O..:

, In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS),
 
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10

Investigation of the physicochemical properties of freeze-d..:

Ayesu Djakari Henry ; Kuntworbe Noble ; Sekyere Michael...
http://www.sciencedirect.com/science/article/pii/S2405844022012853.  , 2022
 
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