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X
Seongmoon Wang
12  Ergebnisse:
Personensuche X
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1

A BIST TPG for Low Power Dissipation and High Fault Coverag:

Seongmoon Wang
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  15 (2007)  7 - p. 777-789 , 2007
Link: https://doi.org/10.1109/..
 
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2

Unknown-tolerance analysis and test-quality control for tes..:

, In: 2006 43rd ACM/IEEE Design Automation Conference,
Chao, M.C.-T. ; Kwang-Ting Cheng ; Seongmoon Wang.. - p. 1083-1088 , 2006
Link: https://doi.org/10.1145/..
 
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3

A Low Overhead High Test Compression Technique Using Patter..:

Wang, Seongmoon ; Wei, Wenlong ; Wang, Zhanglei
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  18 (2010)  12 - p. 1672-1685 , 2010
Link: https://doi.org/10.1109/..
 
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4

Machine learning-based volume diagnosis:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Wang, Seongmoon ; Wei, Wenlong - p. 902-905 , 2009
Link: https://dl.acm.org/doi/1..
 
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5

SoC testing using LFSR reseeding, and scan-slice-based TAM ..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Wang, Zhanglei ; Chakrabarty, Krishnendu ; Wang, Seongmoon - p. 201-206 , 2007
Link: https://dl.acm.org/doi/1..
 
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6

A hybrid scheme for compacting test responses with unknown ..:

, In: Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design,
Chao, Mango C.-T. ; Cheng, Kwang-Ting ; Wang, Seongmoon.. - p. 513-519 , 2007
Link: https://dl.acm.org/doi/1..
 
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7

Unknown blocking scheme for low control data volume and hig..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Wang, Seongmoon ; Wei, Wenlong ; Chakradhar, Srimat T. - p. 33-38 , 2007
Link: https://dl.acm.org/doi/1..
 
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8

Unknown-tolerance analysis and test-quality control for tes..:

, In: Proceedings of the 43rd annual Design Automation Conference,
Chao, Mango C.-T. ; Cheng, Kwang-Ting ; Wang, Seongmoon.. - p. 1083-1088 , 2006
Link: https://dl.acm.org/doi/1..
 
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9

Response shaper : a novel technique to enhance unknown t..:

, In: Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design,
Chao, M. C. -T. ; Wang, Seongmoon ; Chakradhar, S. T.. - p. 80-87 , 2005
Link: https://dl.acm.org/doi/1..
 
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10

Re-configurable embedded core test protocol:

, In: Proceedings of the 2004 Asia and South Pacific Design Automation Conference,
Wang, Seongmoon ; Chakradhar, Srimat T. ; Kedarnath, Balakrishnan - p. 234-237 , 2004
Link: https://dl.acm.org/doi/1..
 
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11

Hybrid Delay Scan : A Low Hardware Overhead Scan-Based D..:

, In: Proceedings of the conference on Design, automation and test in Europe - Volume 2,
Wang, Seongmoon ; Liu, Xiao ; Chakradhar, Srimat T. - p. 21296 ff. , 2004
Link: https://dl.acm.org/doi/1..
 
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12

ATPG for heat dissipation minimization during scan testing:

, In: Proceedings of the 34th annual Design Automation Conference,
Wang, Seongmoon ; Gupta, Sandeep K. - p. 614-619 , 1997
Link: https://dl.acm.org/doi/1..
 
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