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X
Seung-Dong Yang
20548  Ergebnisse:
Personensuche X
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1

Investigation of Intra-Nitride Charge Migration Suppression..:

Yang, Seung-Dong ; Jung, Jun-Kyo ; Lim, Jae-Gab...
Micromachines.  10 (2019)  6 - p. 356 , 2019
Link: https://doi.org/10.3390/..
 
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2

High performance SONOS flash memory with in-situ silicon na..:

Lim, Jae-Gab ; Yang, Seung-Dong ; Yun, Ho-Jin...
Solid-State Electronics.  140 (2018)  - p. 134-138 , 2018
Link: https://doi.org/10.1016/..
 
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3

Investigation of atomic-layer-deposited Al-doped ZnO film f..:

Jeong, Jun-Kyo ; Yun, Ho-Jin ; Yang, Seung-Dong...
Thin Solid Films.  638 (2017)  - p. 89-95 , 2017
Link: https://doi.org/10.1016/..
 
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4

Current–voltage and low-frequency noise analysis of heteroj..:

Ko, Young-Uk ; Yun, Ho-Jin ; Jeong, Kwang-Seok...
Thin Solid Films.  598 (2016)  - p. 109-114 , 2016
Link: https://doi.org/10.1016/..
 
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5

Channel engineering of ZnO-based thin film transistors usin..:

Kim, Seong-Hyeon ; Jeong, Kwang-Seok ; Yun, Ho-Jin...
Japanese Journal of Applied Physics.  53 (2014)  9 - p. 091101 , 2014
Link: https://doi.org/10.7567/..
 
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6

Analysis of stability improvement in ZnO thin film transist..:

Yun, Ho-Jin ; Kim, Young-Su ; Jeong, Kwang-Seok...
Japanese Journal of Applied Physics.  53 (2014)  4S - p. 04EF11 , 2014
Link: https://doi.org/10.7567/..
 
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7

Investigation of the Gate Bias Stress Instability in ZnO Th..:

Jeong, Kwang-Seok ; Yun, Ho-Jin ; Kim, Yu-Mi...
Japanese Journal of Applied Physics.  52 (2013)  4S - p. 04CF04 , 2013
Link: https://doi.org/10.7567/..
 
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8

Characterization of polycrystalline silicon-oxide-nitride-o..:

Lee, Sang-Youl ; Oh, Jae-Sub ; Yang, Seung-Dong...
Electronic Materials Letters.  9 (2013)  S1 - p. 23-27 , 2013
Link: https://doi.org/10.1007/..
 
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9

Investigation of the instability of low-temperature poly-si..:

Kim, Yu-Mi ; Jeong, Kwang-Seok ; Yun, Ho-Jin...
Electronic Materials Letters.  9 (2013)  S1 - p. 13-16 , 2013
Link: https://doi.org/10.1007/..
 
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10

Investigation of zinc interstitial ions as the origin of an..:

Kim, Yu-Mi ; Jeong, Kwang-Seok ; Yun, Ho-Jin...
Applied Physics Letters.  102 (2013)  17 - p. , 2013
Link: https://doi.org/10.1063/..
 
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11

Electrical Instabilities in Amorphous InGaZnO Thin Film Tra..:

Kim, Yu-Mi ; Jeong, Kwang-Seok ; Yun, Ho-Jin...
Japanese Journal of Applied Physics.  51 (2012)  9S2 - p. 09MF10 , 2012
Link: https://doi.org/10.7567/..
 
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12

Comparative Analysis of Bandgap-Engineered Pillar Type Flas..:

LEE, Sang-Youl ; YANG, Seung-Dong ; OH, Jae-Sub...
IEICE Transactions on Electronics.  E95.C (2012)  5 - p. 831-836 , 2012
Link: https://doi.org/10.1587/..
 
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13

Electrical Characteristic Analysis of Postannealed ZnO Thin..:

Jeong, Kwang-Seok ; Kim, Yu-Mi ; Yun, Ho-Jin...
Japanese Journal of Applied Physics.  51 (2012)  9S2 - p. 09MF09 , 2012
Link: https://doi.org/10.7567/..
 
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14

Electrical Characteristic Analysis of Postannealed ZnO Thin..:

Jeong, Kwang-Seok ; Kim, Yu-Mi ; Yun, Ho-Jin...
Japanese Journal of Applied Physics.  51 (2012)  9S2 - p. 09MF09 , 2012
Link: https://doi.org/10.1143/..
 
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15

Electrical Instabilities in Amorphous InGaZnO Thin Film Tra..:

Kim, Yu-Mi ; Jeong, Kwang-Seok ; Yun, Ho-Jin...
Japanese Journal of Applied Physics.  51 (2012)  9S2 - p. 09MF10 , 2012
Link: https://doi.org/10.1143/..
 
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