E-LIB Suche - Ergebnisse für: Shaik, Jani Babu

1

Impact of Aging and Process Variability on SRAM-Based In-Me..:

Shaik, Jani Babu ; Guo, Xinfei ; Singhal, Sonal
IEEE Transactions on Circuits and Systems I: Regular Papers. 71 (2024) 6 - p. 2696-2708 , 2024

Link: https://doi.org/10.1109/..

2

Reliability-aware design of Integrate-and-Fire silicon neur..:

Shaik, Jani Babu ; Picardo, Siona Menezes ; Singhal, Sonal.
Integration. 94 (2024) - p. 102101 , 2024

Link: https://doi.org/10.1016/..

3

Ethidium bromide adsorption on pyrophyllite nanoclay: Insig..:

Shaik, Shajeeya Amren ; Shaik, Jani Babu ; Goswami, Anandarup
Colloids and Surfaces A: Physicochemical and Engineering Aspects. 692 (2024) - p. 133900 , 2024

Link: https://doi.org/10.1016/..

4

Device Reliability Affecting Coding Schemes in Neuromorphic..:

, In: 2022 IEEE Region 10 Symposium (TENSYMP),

Picardo, Siona Menezes ; Shaik, Jani Babu ; Singhal, Sonal. - p. 1-6 , 2022

Link: https://doi.org/10.1109/..

5

Impact of various NBTI distributions on SRAM performance fo..:

Shaik, Jani Babu ; Singhal, Sonal ; Picardo, Siona Menezes.
Integration. 83 (2022) - p. 60-66 , 2022

Link: https://doi.org/10.1016/..

6

Impact of Reliability Issues and Process Variability in Neu..:

, In: 2022 IEEE Region 10 Symposium (TENSYMP),

Shaik, Jani Babu ; Picardo, Siona Menezes ; Singhal, Sonal. - p. 1-6 , 2022

Link: https://doi.org/10.1109/..

7

Enabling efficient rate and temporal coding using reliabili..:

Picardo, Siona Menezes ; Shaik, Jani Babu ; Singhal, Sonal.
International Journal of Circuit Theory and Applications. 50 (2022) 12 - p. 4234-4250 , 2022

Link: https://doi.org/10.1002/..

8

Reliability‐aware design of temporal neuromorphic encoder f..:

Shaik, Jani Babu ; VS, Aadhitiya ; Singhal, Sonal.
International Journal of Circuit Theory and Applications. 50 (2021) 4 - p. 1130-1142 , 2021

Link: https://doi.org/10.1002/..

9

Integral impact of PVT variation with NBTI degradation on d..:

Picardo, Siona Menezes ; Shaik, Jani Babu ; Goel, Nilesh.
International Journal of Electronics. 109 (2021) 2 - p. 293-316 , 2021

Link: https://doi.org/10.1080/..

10

Analysis of SRAM metrics for data dependent BTI degradation..:

Shaik, Jani Babu ; Singhal, Sonal ; Goel, Nilesh
Integration. 72 (2020) - p. 148-162 , 2020

Link: https://doi.org/10.1016/..

11

Analyzing the Impact of NBTI and Process Variability on Dyn..:

, In: Lecture Notes in Electrical Engineering; Modelling, Simulation and Intelligent Computing,

Picardo, Siona Menezes ; Shaik, Jani Babu ; Sahni, Sakshi.. - p. 608-616 , 2020

Link: https://doi.org/10.1007/..

12

FPGA Implementation of Random Feature Mapping in ELM Algori..:

, In: Lecture Notes in Electrical Engineering; Modelling, Simulation and Intelligent Computing,

Gill, Prabhleen Kaur ; Babu, Shaik Jani ; Singhal, Sonal. - p. 504-510 , 2020

Link: https://doi.org/10.1007/..

13

Investigating the Impact of BTI and HCI on Log-Domain Based..:

, In: Lecture Notes in Electrical Engineering; Modelling, Simulation and Intelligent Computing,

Babu, Shaik Jani ; Vipperla, Anish ; Murthy, Haarica Vinayaga... - p. 528-536 , 2020

Link: https://doi.org/10.1007/..

14

Analyzing Impact of NBTI and Time-Zero Variability on Dynam..:

, In: 2018 15th IEEE India Council International Conference (INDICON),

Babu, Shaik Jani ; Chaudhari, Sarthak Prakash ; Singhal, Sonal. - p. 1-5 , 2018

Link: https://doi.org/10.1109/..

15

Design and Mathematical Modelling of Inter Spike Interval o..:

VS, Aadhitiya ; Shaik, Jani Babu ; Singhal, Sonal..
http://arxiv.org/abs/2205.09519. , 2022

Link: http://arxiv.org/abs/220..