Shanker, Nirmaan
17  Ergebnisse:
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6

On the PBTI Reliability of Low EOT Negative Capacitance 1.8..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Shanker, Nirmaan ; Wang, Li-Chen ; Cheema, Suraj... - p. 421-422 , 2022
 
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8

FeFETs for Near-Memory and In-Memory Compute:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Salahuddin, Saveef ; Tan, Ava ; Cheema, Suraj... - p. 19.4.1-19.4.4 , 2021
 
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