E-LIB Suche - Ergebnisse für: Shard, A. G .

1

Electron spectroscopy using transition-edge sensors:

Patel, K. M. ; Withington, S. ; Shard, A. G ...
Journal of Applied Physics. 135 (2024) 22 - p. , 2024

Link: https://doi.org/10.1063/..

2

Chemical and structural identification of material defects ..:

de Graaf, S E ; Un, S ; Shard, A G.
Materials for Quantum Technology. 2 (2022) 3 - p. 032001 , 2022

Link: https://doi.org/10.1088/..

3

Characterization of buried interfaces using Ga Kα hard X-ra..:

Spencer, B. F. ; Church, S. A. ; Thompson, P....
Faraday Discussions. 236 (2022) - p. 311-337 , 2022

Link: https://doi.org/10.1039/..

4

Inelastic background modelling applied to hard X-ray photoe..:

Spencer, B.F. ; Maniyarasu, S. ; Reed, B.P....
Applied Surface Science. 541 (2021) - p. 148635 , 2021

Link: https://doi.org/10.1016/..

5

Simulation method for investigating the use of transition-e..:

Patel, K M ; Withington, S ; Thomas, C N..
Superconductor Science and Technology. 34 (2021) 12 - p. 125007 , 2021

Link: https://doi.org/10.1088/..

6

Comparisons of Analytical Approaches for Determining Shell ..:

Powell, C. J. ; Werner, W. S. M. ; Kalbe, H...
The Journal of Physical Chemistry C. 122 (2018) 7 - p. 4073-4082 , 2018

Link: https://doi.org/10.1021/..

7

The matrix effect in secondary ion mass spectrometry:

Seah, M.P. ; Shard, A.G.
Applied Surface Science. 439 (2018) - p. 605-611 , 2018

Link: https://doi.org/10.1016/..

8

Summary of ISO/TC 201 standard: ISO 19668—Surface chemical ..:

Shard, A. G. ; Clifford, C. A.
Surface and Interface Analysis. 50 (2017) 1 - p. 87-89 , 2017

Link: https://doi.org/10.1002/..

9

Evaluation of Two Methods for Determining Shell Thicknesses..:

Powell, C. J. ; Werner, W. S. M. ; Shard, A. G..
The Journal of Physical Chemistry C. 120 (2016) 39 - p. 22730-22738 , 2016

Link: https://doi.org/10.1021/..

10

Correction to "Evaluating the Internal Structure of Core–Sh..:

Chudzicki, M. ; Werner, W. S. M. ; Shard, A. G....
The Journal of Physical Chemistry C. 120 (2016) 4 - p. 2484-2484 , 2016

Link: https://doi.org/10.1021/..

11

Film thickness measurement and contamination layer correcti..:

Walton, J. ; Alexander, M. R. ; Fairley, N...
Surface and Interface Analysis. 48 (2016) 3 - p. 164-172 , 2016

Link: https://doi.org/10.1002/..

12

Evaluating the Internal Structure of Core–Shell Nanoparticl..:

Chudzicki, M. ; Werner, W. S. M. ; Shard, A. G....
The Journal of Physical Chemistry C. 119 (2015) 31 - p. 17687-17696 , 2015

Link: https://doi.org/10.1021/..

13

Angle Dependence of Argon Gas Cluster Sputtering Yields for..:

Seah, M. P. ; Spencer, S. J. ; Shard, A. G.
The Journal of Physical Chemistry B. 119 (2015) 7 - p. 3297-3303 , 2015

Link: https://doi.org/10.1021/..

14

Sputtering Yields for Mixtures of Organic Materials Using A..:

Seah, M. P. ; Havelund, R. ; Shard, A. G..
The Journal of Physical Chemistry B. 119 (2015) 42 - p. 13433-13439 , 2015

Link: https://doi.org/10.1021/..

15

Depth resolution at organic interfaces sputtered by argon g..:

Seah, M. P. ; Spencer, S. J. ; Havelund, R...
The Analyst. 140 (2015) 19 - p. 6508-6516 , 2015

Link: https://doi.org/10.1039/..