Sheen, Jyh
36  Ergebnisse:
Personensuche X
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1

Ku-band Bandpass Filter Design with Compact Size and Broad ..:

, In: 2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring),
Sheen, Jyh ; Cheng, Yang-Hung ; Liu, Weihsing - p. 1022-1026 , 2019
 
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3

Low-temperature–sintered CuF 2 -doped NKN ceramics with exc..:

Weng, Chung-Ming ; Tsai, Cheng-Che ; Sheen, Jyh...
Journal of Alloys and Compounds.  698 (2017)  - p. 1028-1037 , 2017
 
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5

Lead-Free NKN-Based Materials for Ultrasonic Therapeutic Tr..:

Weng, Chung-Ming ; Tsai, Cheng-Che ; Hong, Cheng-Shong..
ECS Journal of Solid State Science and Technology.  6 (2017)  10 - p. P733-P740 , 2017
 
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6

Effects of Non-Stoichiometry on the Microstructure, Oxygen ..:

Weng, Chung-Ming ; Tsai, Cheng-Che ; Hong, Cheng-Shong...
ECS Journal of Solid State Science and Technology.  5 (2016)  9 - p. N49-N56 , 2016
 
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7

Adaptive multipath mitigation tracking system for GPS recei..:

Mao, Wei-Lung ; Du, Jiun-Shian ; Sheen, Jyh.
Aerospace Science and Technology.  30 (2013)  1 - p. 66-78 , 2013
 
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8

Design of a Microwave Bandpass Filter with Compact Size and..:

Sheen, Jyh ; Cheng, Yang‐Hung ; Liu, Weihsing
Microwave and Optical Technology Letters.  55 (2013)  8 - p. 1860-1863 , 2013
 
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9

Studies of dielectric constant measurements at microwave fr..:

Sheen, Jyh ; Hong, Zuo‐Wen ; Liu, Weihsing.
Microwave and Optical Technology Letters.  53 (2011)  11 - p. 2481-2485 , 2011
 
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11

Comparisons of microwave dielectric property measurements b..:

Sheen, Jyh
Measurement Science and Technology.  20 (2009)  4 - p. 042001 , 2009
 
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13

Measurements of dielectric properties of TiO2 thin films at..:

Sheen, Jyh ; Li, Chueh-Yu ; Ji, Liang-Wen...
Journal of Materials Science: Materials in Electronics.  21 (2009)  8 - p. 817-821 , 2009
 
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14

A modified field model of waveguide reflection dielectric r..:

Sheen, Jyh
Journal of Applied Physics.  103 (2008)  3 - p. , 2008
 
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15

Dielectric Dispersion at Microwave Frequencies of Some Low ..:

Sheen, Jyh ; Guo, Runyan ; Bhalla, A. S..
Ferroelectrics Letters Section.  35 (2008)  3-4 - p. 79-85 , 2008
 
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