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2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
1
Application of Si Plasmon Imaging in Semiconductor Failure ..:
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2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
2
Advanced TEM sample preparation and imaging techniques in s..:
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2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
3