E-LIB Suche - Ergebnisse für: Shigetoshi, Takushi - Sprache DE

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1

Influence of H2O in bonding interfaces on bonding strength ..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),

Yoshioka, Hirotaka ; Fujii, Nobutoshi ; Shigetoshi, Takushi... - p. 1119-1123 , 2023

Link: https://doi.org/10.1109/..

2

Effects of hydrogen-damaged layer on tin-doped indium oxide..:

Hirata, Akiko ; Fukasawa, Masanaga ; Shigetoshi, Takushi...
Japanese Journal of Applied Physics. 56 (2017) 6S2 - p. 06HD02 , 2017

Link: https://doi.org/10.7567/..

3

Control of SiO2/Si interface defects generation during thin..:

Shigetoshi, Takushi ; Fukasawa, Masanaga ; Nagahata, Kazunori.
Japanese Journal of Applied Physics. 54 (2015) 6S2 - p. 06GB05 , 2015

Link: https://doi.org/10.7567/..

4

Ex situ scanning tunneling microscopy study of Cu nanowires..:

Yoshimatsu, Akina ; Shigetoshi, Takushi ; Uchikoshi, Junichi..
Surface and Interface Analysis. 40 (2008) 6-7 - p. 1134-1137 , 2008

Link: https://doi.org/10.1002/..

5

Profile Measurements of Microscratches Remaining on Polishe..:

Shigetoshi, Takushi ; Inoue, Haruyuki ; Kawashima, Tsukasa...
ECS Transactions. 3 (2007) 41 - p. 65-71 , 2007

Link: https://doi.org/10.1149/..

6

Microscratches with Depths of Angstrom Order on Si Wafers D..:

Shigetoshi, Takushi ; Inoue, Haruyuki ; Kawashima, Tsukasa...
Electrochemical and Solid-State Letters. 10 (2007) 7 - p. H206 , 2007

Link: https://doi.org/10.1149/..

7

Surface photovoltage measurements of intrinsic hydrogenated..:

Arima, Kenta ; Shigetoshi, Takushi ; Kakiuchi, Hiroaki.
Physica B: Condensed Matter. 376-377 (2006) - p. 893-896 , 2006

Link: https://doi.org/10.1016/..

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