Shirakura, Daichi
7  Ergebnisse:
Personensuche X
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1

P‐116: Elucidation of OLED Degradation Mechanism Using Mass..:

Sawada, Keisuke ; Shirakura, Daichi ; Shibamori, Takahiro...
SID Symposium Digest of Technical Papers.  54 (2023)  1 - p. 1291-1293 , 2023
 
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2

3‐2: Analyzing the Degradation Process of Quantum‐Dot LEDs ..:

Mo, Hin-Wai ; Shirakura, Daichi ; Harada, Kentaro...
SID Symposium Digest of Technical Papers.  53 (2022)  1 - p. 1-4 , 2022
 
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3

69‐3: Examination of Degradation Analysis of p‐i‐n Type OLE..:

Shirakura, Daichi ; Okamura, Shinji ; Taguchi, Yoshihiko...
SID Symposium Digest of Technical Papers.  51 (2020)  1 - p. 1033-1035 , 2020
 
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4

19‐3: Examination in Application of TOF‐SIMS with MS/MS to ..:

Shirakura, Daichi ; Suzuki, Aki ; Okamura, Shinji...
SID Symposium Digest of Technical Papers.  50 (2019)  1 - p. 256-258 , 2019
 
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5

Reconstruction Method for Atom Probe Tomography by Using Fi..:

Kim, Yun ; Yukawa, Tsuyoshi ; Shirakura, Daichi..
e-Journal of Surface Science and Nanotechnology.  14 (2016)  0 - p. 189-192 , 2016
 
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6

Study of Thickness Distributions of Sputtered Gold Particle..:

Akiba, Shouta ; Yamazaki, Atsuko ; Shirakura, Daichi..
e-Journal of Surface Science and Nanotechnology.  14 (2016)  0 - p. 87-91 , 2016
 
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