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X
Shirasawa, Katsuhiko
55  Ergebnisse:
Personensuche X
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1

Investigation of Light-Induced Degradation in B-Doped Mono-..:

Ino, Yuji ; Heito, Shunsuke ; Itou, Norikazu...
IEEE Journal of Photovoltaics.  13 (2023)  1 - p. 48-55 , 2023
Link: https://doi.org/10.1109/..
 
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2

Development of lightweight and flexible crystalline silicon..:

Tachibana, Tomihisa ; Shirasawa, Katsuhiko ; Tanahashi, Katsuto
Solar Energy Materials and Solar Cells.  262 (2023)  - p. 112541 , 2023
Link: https://doi.org/10.1016/..
 
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3

Stencil-masked phosphorus-implanted silicon for solar cell ..:

Tanahashi, Katsuto ; Moriya, Masaaki ; Shirasawa, Katsuhiko.
Materials Science in Semiconductor Processing.  124 (2021)  - p. 105589 , 2021
Link: https://doi.org/10.1016/..
 
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4

Investigation of electrical shading loss of bifacial interd..:

Tomihisa, Tachibana ; Shirasawa, Katsuhiko ; Takato, Hidetaka
Japanese Journal of Applied Physics.  59 (2020)  11 - p. 116503 , 2020
Link: https://doi.org/10.35848..
 
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5

Formation of Local Rear Contacts Stimulated by Al-Si Interd..:

, In: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC),
Joonwichien, Supawan ; Utsunomiya, Satoshi ; Moriya, Masaaki... - p. 0052-0055 , 2020
Link: https://doi.org/10.1109/..
 
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6

An Influence of the Module Structure on Reliability of Crys..:

Semba, Taeko ; Saito, Genki ; Asao, Shuichi..
Transactions of The Japan Institute of Electronics Packaging.  13 (2020)  0 - p. E19-010-1-E19-010-6 , 2020
Link: https://doi.org/10.5104/..
 
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7

Effect of Oxygen Precipitation in Silicon Wafer on Electric..:

Tanahashi, Katsuto ; Tachibana, Tomihisa ; Sueoka, Koji...
ECS Journal of Solid State Science and Technology.  8 (2019)  10 - p. P596-P601 , 2019
Link: https://doi.org/10.1149/..
 
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8

Metal-induced Recombination Losses associated with Si prese..:

, In: 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC),
Joonwichien, Supawan ; Moriya, Masaaki ; Utsunomiya, Satoshi... - p. 3252-3257 , 2019
Link: https://doi.org/10.1109/..
 
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9

Screen-printed contacts with H-patterned n-type passivated ..:

Simayi, Shalamujiang ; Kida, Yasuhiro ; Utsunomiya, Satoshi..
Japanese Journal of Applied Physics.  57 (2018)  8S3 - p. 08RB09 , 2018
Link: https://doi.org/10.7567/..
 
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10

The impact of subsurface damage on the fracture strength of..:

Sekhar, Halubai ; Fukuda, Tetsuo ; Tanahashi, Katsuto...
Japanese Journal of Applied Physics.  57 (2018)  8S3 - p. 08RB08 , 2018
Link: https://doi.org/10.7567/..
 
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11

Assisted passivation by a chemically grown SiO2 layer for p..:

Joonwichien, Supawan ; Kida, Yasuhiro ; Moriya, Masaaki...
Solar Energy Materials and Solar Cells.  186 (2018)  - p. 84-91 , 2018
Link: https://doi.org/10.1016/..
 
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12

Evaluation of carrier collection probability in bifacial in..:

Tachibana, Tomihisa ; Tanahashi, Katsuto ; Mochizuki, Toshimitsu..
Japanese Journal of Applied Physics.  57 (2018)  4 - p. 040315 , 2018
Link: https://doi.org/10.7567/..
 
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13

The impact of saw mark direction on the fracture strength o..:

Sekhar, Halubai ; Fukuda, Tetsuo ; Tanahashi, Katsuto...
Japanese Journal of Applied Physics.  57 (2018)  9 - p. 095501 , 2018
Link: https://doi.org/10.7567/..
 
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14

Internal quantum efficiency mapping for evaluation of rear ..:

Mochizuki, Toshimitsu ; Joonwichien, Supawan ; Tanahashi, Katsuto...
Applied Physics Express.  11 (2018)  8 - p. 086601 , 2018
Link: https://doi.org/10.7567/..
 
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15

Probing the surface potential of oxidized silicon by assess..:

Mochizuki, Toshimitsu ; Ito, Akira ; Mitchell, Jonathon...
Applied Physics Letters.  110 (2017)  16 - p. , 2017
Link: https://doi.org/10.1063/..
 
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