E-LIB Suche - Ergebnisse für: Shono, Katsufusa

1

Control of Surface Concentration of Boron or Phosphorus Emp..:

Kasamatsu, Akifumi ; Takakubo, Hajime ; Shono, Katsufusa
Journal of The Electrochemical Society. 143 (1996) 2 - p. 712-716 , 1996

Link: https://doi.org/10.1149/..

2

An image tracing approach using CMOS variable threshold log..:

Takakubo, Hajime ; Shono, Katsufusa
Microprocessors and Microsystems. 16 (1992) 8 - p. 395-402 , 1992

Link: https://doi.org/10.1016/..

3

Two-bit microcomputer for educational use:

Kang, Ryo-Il ; Shono, Katsufusa
Microprocessors and Microsystems. 15 (1991) 6 - p. 299-304 , 1991

Link: https://doi.org/10.1016/..

4

Experimental Study of NH3-O2 Oxidation of Si Wafers:

Yen-Chuan Tseng, Yen-Chuan Tseng ; Katsufusa Shono, Katsufusa Shono
Japanese Journal of Applied Physics. 30 (1991) 2A - p. L222 , 1991

Link: https://doi.org/10.1143/..

5

A New Method for Obtaining A Clean SiO2-Si Interface Using ..:

Tseng, Yen-Chuan ; Shono, Katsufusa
Japanese Journal of Applied Physics. 28 (1989) 2A - p. L329 , 1989

Link: https://doi.org/10.1143/..

6

A New Blanking Method for Electron Beam Lithography Using S..:

Park, Sun-Woo ; Shono, Katsufusa
Japanese Journal of Applied Physics. 26 (1987) 1A - p. L44 , 1987

Link: https://doi.org/10.1143/..

7

A New Position Alignment Method in Electron-Beam Direct Wri..:

Park, Sun-Woo ; Shono, Katsufusa ; Dumin, David J.
Japanese Journal of Applied Physics. 26 (1987) 6A - p. L968 , 1987

Link: https://doi.org/10.1143/..

8

Current-Voltage Characteristics of BP p-n Junction:

Yoshida, Tohru ; Shono, Katsufusa ; Lee, Jong Duk
Japanese Journal of Applied Physics. 24 (1985) 4A - p. L275 , 1985

Link: https://doi.org/10.1143/..

9

Chemical Vapor‐Deposited Boron Nitride Film on Silicon as a..:

Kim, Chol ; Sohn, Byung‐Ki ; Shono, Katsufusa
Journal of The Electrochemical Society. 131 (1984) 6 - p. 1384-1388 , 1984

Link: https://doi.org/10.1149/..

10

Current-voltage characteristics of a Si-BP-Si double hetero..:

Sugiura, Souichi ; Yoshida, Tohru ; Shono, Katsufusa.
Applied Physics Letters. 44 (1984) 11 - p. 1069-1071 , 1984

Link: https://doi.org/10.1063/..

11

Crystalline characterization of Si/BP/Si heteroepitaxy:

Amano, Jun ; Yoshida, Tohru ; Shono, Katsufusa
Applied Physics Letters. 45 (1984) 10 - p. 1112-1113 , 1984

Link: https://doi.org/10.1063/..

12

Epitaxial Si Layer of Si-BP-Si Structure:

Sugiura, Souichi ; Yoshida, Tohru ; Shono, Katsufusa
Japanese Journal of Applied Physics. 22 (1983) 7A - p. L426 , 1983

Link: https://doi.org/10.1143/..

13

Reflection electron diffraction patterns from Si layers epi..:

Shono, Katsufusa ; Kim, Chul-Ju
Journal of Crystal Growth. 56 (1982) 2 - p. 511-515 , 1982

Link: https://doi.org/10.1016/..

14

Measurement of Electrical Resistivity of CVD-BN Passivation..:

Kim, Chol ; Shono, Katsufusa
Japanese Journal of Applied Physics. 20 (1981) 10 - p. 1901 , 1981

Link: https://doi.org/10.1143/..