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Siah, Kok S
94  Ergebnisse:
Personensuche X
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1

Aerosol‐Jet‐Printed Encapsulation of Organic Photovoltaics:

Basu, Robin ; Siah, Kok S. ; Distler, Andreas...
Advanced Engineering Materials.  25 (2023)  17 - p. , 2023
Link: https://doi.org/10.1002/..
 
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Aerosol‐Jet‐Printed Encapsulation of Organic Photovoltaics:

Basu, Robin ; Siah, Kok S ; Distler, Andreas...
info:eu-repo/semantics/altIdentifier/doi/10.34734/FZJ-2024-00867.  , 2023
Link: https://juser.fz-juelich..
 
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3

New constitutive equations for the rapid flow of granular m..:

Shaninpoor, M. ; Siah, J.S.S.
Journal of Non-Newtonian Fluid Mechanics.  9 (1981)  1-2 - p. 147-156 , 1981
Link: https://doi.org/10.1016/..
 
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4

A novel microstrip-fed slot-coupled self-complementary patc..:

Ooi, B. L. ; Siah, E. S. ; Kooi, P. S.
Microwave and Optical Technology Letters.  23 (1999)  5 - p. 284-289 , 1999
Link: https://doi.org/10.1002/..
 
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5

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Naik, V. B. ; Lim, J. H. ; Yamane, K.... - p. 6B.3-1-6B.3-6 , 2022
Link: https://doi.org/10.1109/..
 
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6

STT-MRAM Product Reliability and Cross-Talk:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Naik, V. B. ; Yamane, K. ; Kwon, J.... - p. 366-368 , 2022
Link: https://doi.org/10.1109/..
 
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7

Fast Switching of STT-MRAM to Realize High Speed Applicatio..:

, In: 2020 IEEE Symposium on VLSI Technology,
Lee, T. Y. ; Yamane, K. ; Kwon, J.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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8

Magnetic Immunity Guideline for Embedded MRAM Reliability t..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lee, T. Y. ; Yamane, K. ; Hau, L. Y.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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9

A Reliable TDDB Lifetime Projection Model Verified Using 40..:

, In: 2020 IEEE Symposium on VLSI Technology,
Naik, V. B. ; Yamane, K. ; Lim, J. H.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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10

Manufacturable 22nm FD-SOI Embedded MRAM Technology for Ind..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Naik, V. B. ; Lim, J. H. ; Lee, T. Y.... - p. 2.3.1-2.3.4 , 2019
Link: https://doi.org/10.1109/..
 
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11

40nm Embedded Self-Aligned Split-Gate Flash Technology for ..:

, In: 2017 IEEE International Memory Workshop (IMW),
Shum, Danny ; Luo, Lai Q. ; Kong, Y.J.... - p. 1-4 , 2017
Link: https://doi.org/10.1109/..
 
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12

The effect of sub-oxide phases on the transparency of tin-d..:

Lim, K. ; Schelhas, L. T. ; Siah, S. C....
Applied Physics Letters.  109 (2016)  14 - p. , 2016
Link: https://doi.org/10.1063/..
 
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13

Proof-of-concept framework to separate recombination proces..:

Siah, S. C. ; Winkler, M. T. ; Powell, D. M....
Journal of Applied Physics.  117 (2015)  10 - p. , 2015
Link: https://doi.org/10.1063/..
 
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14

Dopant activation in Sn-doped Ga2O3 investigated by X-ray a..:

Siah, S. C. ; Brandt, R. E. ; Lim, K....
Applied Physics Letters.  107 (2015)  25 - p. , 2015
Link: https://doi.org/10.1063/..
 
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15

Accurate characterization of thin films on rough surfaces b..:

Siah, S.C. ; Hoex, B. ; Aberle, A.G.
Thin Solid Films.  545 (2013)  - p. 451-457 , 2013
Link: https://doi.org/10.1016/..
 
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