Sierawski, Brian D.
15  Ergebnisse:
Personensuche X
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1

Contribution of Secondary Alpha Particles to Soft Error Rat..:

Cadena, Rick M. ; Warren, Kevin M. ; Dodds, Nathaniel A....
IEEE Transactions on Nuclear Science.  71 (2024)  4 - p. 535-541 , 2024
 
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5

Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si C..:

Gorchichko, Mariia ; Zhang, En Xia ; Reaz, Mahmud...
IEEE Transactions on Electron Devices.  70 (2023)  6 - p. 3215-3222 , 2023
 
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8

Automatic Fault Tree Generation from Radiation-Induced Faul..:

, In: 2020 Annual Reliability and Maintainability Symposium (RAMS),
 
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10

Applications of heavy ion microprobe for single event effec..:

Reed, Robert A. ; Vizkelethy, Gyorgy ; Pellish, Jonathan A....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  261 (2007)  1-2 - p. 443-446 , 2007
 
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11

WITHDRAWN: Applications of Heavy Ion Microprobe for Single ..:

Reed, Robert A. ; Vizkelethy, Gyorgy ; Pellish, Jonathan A....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  , 2007
 
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12

Satometer: : how much have we searched?:

, In: Proceedings of the 39th annual Design Automation Conference,
 
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