Singh, Prabjit
9  Ergebnisse:
Personensuche X
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1

Comparing Electromigration in Tin-Bismuth Alloys using plan..:

, In: 2024 International Conference on Electronics Packaging (ICEP),
Singh, Prabjit ; Palmer, L. ; Wassick, T.... - p. 55-56 , 2024
 
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2

In Situ Study of Electromigration in Eutectic Tin-Bismuth P..:

, In: 2024 Pan Pacific Strategic Electronics Symposium (Pan Pacific),
Singh, Prabjit ; Palmer, L. ; Hamid, M.... - p. 1-6 , 2024
 
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3

Electromigration in tin-bismuth planar solder joints:

, In: 2023 International Conference on Electronics Packaging (ICEP),
Singh, Prabjit ; Palmer, L. ; Hamid, M.... - p. 201-202 , 2023
 
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4

Permeation of moisture out of EPDM rubber hoses:

, In: 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm),
Singh, Prabjit ; Palmer, Larry - p. 1-6 , 2022
 
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5

A Case Study of Nickel Dendritic Growth on Printed-Circuit ..:

, In: 2020 Pan Pacific Microelectronics Symposium (Pan Pacific),
 
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6

Conformal Coating Characterization Using Stacked Silver Thi..:

, In: 2020 Pan Pacific Microelectronics Symposium (Pan Pacific),
 
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7

Measuring Water Permeation Through EPDM Rubber Hoses:

, In: 2019 18th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm),
Singh, Prabjit ; Palmer, Larry - p. 65-69 , 2019
 
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8

Materials developments in microelectronic packaging: perfor.. 

proceedings of the fourth Electronic Materials and Processi... 
Exemplar:  Zentrale: a elt 714 i/566
 
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