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2024 IEEE 42nd VLSI Test Symposium (VTS) ,
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Innovative Practices Track: Session 3 Test and Functional S..:
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2024 IEEE 42nd VLSI Test Symposium (VTS) ,
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Innovative Practices Track: Session 2 Silent Data Corruptio:
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2024 IEEE 42nd VLSI Test Symposium (VTS) ,
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Innovative Practices Track: Session 4 AI Applications in Te..:
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2023 IEEE International Test Conference (ITC) ,
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Maximizing Stress Coverage by Novel DFT Techniques and Rela..:
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2022 IEEE 31st Asian Test Symposium (ATS) ,
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Using Fault Detection Tests to Produce Diagnostic Tests Tar..:
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2022 IEEE 40th VLSI Test Symposium (VTS) ,
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Innovative Practices Track: Next Generation Test Standards:
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2022 IEEE International Test Conference (ITC) ,
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Multi-die Parallel Test Fabric for Scalability and Pattern ..:
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2021 IEEE European Test Symposium (ETS) ,
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Synergies Between Delay Test and Post-silicon Speed Path Va..:
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2020 IEEE International Test Conference (ITC) ,
10
SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Intern..:
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2019 IEEE International Test Conference (ITC) ,
11
Characterization of Library Cells for Open-circuit Defect E..:
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2017 IEEE 35th VLSI Test Symposium (VTS) ,
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Innovative practices session 1C screening for layout sensit..:
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2010 28th VLSI Test Symposium (VTS) ,
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