Song, Zhi-Tang
19408  Ergebnisse:
Personensuche X
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1

A high PSR and high-precision current-mode bandgap referenc..:

Chen, Zhi-Zhi ; Wang, Qian ; Li, Xi...
Microelectronics Journal.  142 (2023)  - p. 106014 , 2023
 
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2

WN coating of TiN electrode to improve the reliability of p..:

Cui, Zi-Jing ; Cai, Dao-Lin ; Li, Yang..
Materials Science in Semiconductor Processing.  138 (2022)  - p. 106273 , 2022
 
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5

Investigation of the effect of blade electrode width on per..:

Cui, Zi-Jing ; Cai, Dao-Lin ; Li, Yang...
Semiconductor Science and Technology.  36 (2021)  10 - p. 105003 , 2021
 
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6

Optimization of driving current and crosstalk effect in epi..:

Li, Yang ; Cai, Dao-Lin ; Chen, Yi-Feng...
Semiconductor Science and Technology.  35 (2020)  11 - p. 115001 , 2020
 
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7

Endurance Improvement of Phase Change Memory Based on High ..:

Wu, Lei ; Cai, Dao-Lin ; Chen, Yi-Feng...
ECS Journal of Solid State Science and Technology.  9 (2020)  3 - p. 035004 , 2020
 
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8

Analysis and optimization of read/write reliability for 12F..:

Li, Yang ; Chen, Yi-Feng ; Cai, Dao-Lin...
Semiconductor Science and Technology.  34 (2019)  11 - p. 115013 , 2019
 
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9

High performance of multilevel-cell phase change memory dev..:

Liu, Yuan-Guang ; Chen, Yi-Feng ; Cai, Dao-Lin...
Semiconductor Science and Technology.  34 (2019)  10 - p. 105019 , 2019
 
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10

RESET current optimization for phase change memory based on..:

Wu, Lei ; Chen, Yi-Feng ; Cai, Dao-Lin...
Materials Science in Semiconductor Processing.  97 (2019)  - p. 11-16 , 2019
 
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11

Fast switching and low drift of TiSbTe thin films for phase..:

Liu, Yuan-Guang ; Chen, Yi-Feng ; Cai, Dao-Lin...
Materials Science in Semiconductor Processing.  91 (2019)  - p. 399-403 , 2019
 
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13

The Influence of the Bitline Length on the Resistance Consi..:

Lu, Yao-Yao ; Cai, Dao-Lin ; Chen, Yi-Feng...
ECS Journal of Solid State Science and Technology.  7 (2018)  3 - p. Q33-Q37 , 2018
 
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14

A novel non-volatile memory storage system for I/O-intensiv..:

Han, Wen-Bing ; Chen, Xiao-Gang ; Li, Shun-Fen...
Frontiers of Information Technology & Electronic Engineering.  19 (2018)  10 - p. 1291-1302 , 2018
 
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