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2023 IEEE 33rd International Conference on Microelectronics (MIEL) ,
3
Characterization of the Electric Breakdowns in Metal-Insula..:
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2023 IEEE 33rd International Conference on Microelectronics (MIEL) ,
6
Effects in Commercial p-Channel Power VDMOS Transistors Ini..:
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2019 IEEE 31st International Conference on Microelectronics (MIEL) ,
13