Spear, Matthew
708  Ergebnisse:
Personensuche X
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2

TID Effects on Random Telegraph Signals in Bulk 90 nm MOSFE..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
 
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3

Statistical Characterization of ReRAM Arrays for Analog In-..:

, In: 2023 IEEE International Conference on Rebooting Computing (ICRC),
Short, Jesse ; Spear, Matthew ; Wilson, Donald... - p. 1-5 , 2023
 
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4

Non-Linear Coupling Effects in Fully Depleted SOI Transisto..:

Spear, Matthew ; Barnaby, Hugh J. ; Wallace, Trace...
IEEE Transactions on Nuclear Science.  70 (2023)  4 - p. 434-441 , 2023
 
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5

The Impact of Analog-to-Digital Converter Architecture and ..:

Spear, Matthew ; Kim, Joshua E. ; Bennett, Christopher H....
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits.  9 (2023)  2 - p. 176-184 , 2023
 
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6

TCAD Calibrated SEE Fault Model Validated with Beam Results..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
 
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7

Analog Neural Network Inference Accuracy in One-Selector On..:

, In: 2022 IEEE International Conference on Rebooting Computing (ICRC),
 
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8

Radiation-induced Enhancement of Scattering Effects in FD-S..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
 
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9

Single Event Upset and Total Ionizing Dose Response of 12LP..:

, In: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC),
 
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10

Total Ionizing Dose Response of Commercial 22nm FD-SOI CMOS..:

, In: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC),
Solano, Jose ; Spear, Matthew ; Wallace, Trace... - p. 1-5 , 2022
 
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