Statham, Peter J.
159  Ergebnisse:
Personensuche X
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1

Use of Spectrum Simulation to Acquire Reliable Scans with a..:

Pinard, Philippe ; Jones, Rosie ; Spasevski, Lucia..
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 81-82 , 2023
 
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6

Dynamic Electron and X-ray Imaging is a Moving Experience:

Burgess, Simon ; Mansour, Haithem ; Hyde, Anthony...
Microscopy and Microanalysis.  27 (2021)  S1 - p. 1840-1841 , 2021
 
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10

X-ray Spectrum Imaging at High Resolution in the STEM and S..:

Sagar, James ; Wood, Dylan ; Pinard, Philippe...
Microscopy and Microanalysis.  24 (2018)  S1 - p. 656-657 , 2018
 
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11

Joy of Scanning with Electron and X-ray Imaging:

Pinard, Philippe T. ; Burgess, Simon ; Hyde, Anthony..
Microscopy and Microanalysis.  24 (2018)  S1 - p. 624-625 , 2018
 
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