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Sterpone, L.
563  Ergebnisse:
Personensuche X
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1

Evaluating reliability against SEE of embedded systems: A c..:

De Sio, C. ; Azimi, S. ; Sterpone, L.
Microelectronics Reliability.  150 (2023)  - p. 115124 , 2023
Link: https://doi.org/10.1016/..
 
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2

Assessing Convolutional Neural Networks Reliability through..:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Ruospo, A. ; Gavarini, G. ; de Sio, C.... - p. 1-6 , 2023
Link: https://doi.org/10.23919..
 
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3

Test, Reliability and Functional Safety Trends for Automoti..:

, In: 2022 IEEE European Test Symposium (ETS),
Angione, F. ; Appello, D. ; Aribido, J.... - p. 1-10 , 2022
Link: https://doi.org/10.1109/..
 
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4

A comparative radiation analysis of reconfigurable memory t..:

Azimi, S. ; De Sio, C. ; Portaluri, A...
Microelectronics Reliability.  138 (2022)  - p. 114733 , 2022
Link: https://doi.org/10.1016/..
 
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5

Analysis and Mitigation of Soft-Errors on High Performance ..:

, In: 2022 21st International Symposium on Parallel and Distributed Computing (ISPDC),
Sterpone, L. ; Azimi, S. ; De Sio, C.. - p. 91-98 , 2022
Link: https://doi.org/10.1109/..
 
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6

Failure rate analysis of radiation tolerant design techniqu..:

Vacca, E. ; Azimi, S. ; Sterpone, L.
Microelectronics Reliability.  138 (2022)  - p. 114778 , 2022
Link: https://doi.org/10.1016/..
 
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7

Analysis of radiation-induced transient errors on 7 nm FinF..:

Azimi, S. ; De Sio, C. ; Sterpone, L.
Microelectronics Reliability.  126 (2021)  - p. 114319 , 2021
Link: https://doi.org/10.1016/..
 
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8

A Neutron Generator Testing Platform for the Radiation Anal..:

, In: 2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC),
Bozzoli, L. ; De Sio, C. ; Du, B.. - p. 1-5 , 2021
Link: https://doi.org/10.1109/..
 
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9

A dynamic hardware redundancy mechanism for the in-field fa..:

, In: 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS),
Rodriguez Condia, Josie E. ; Narducci, Pierpaolo ; Reorda, M. Sonza. - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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10

A dynamic reconfiguration mechanism to increase the reliabi..:

, In: 2020 IEEE 38th VLSI Test Symposium (VTS),
Rodriguez Condia, Josie E. ; Narducci, Pierpaolo ; Reorda, M. Sonza. - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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11

RESCUE: Interdependent Challenges of Reliability, Security ..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Jenihhin, M. ; Hamdioui, S. ; Reorda, M. Sonza... - p. 388-393 , 2020
Link: https://doi.org/10.23919..
 
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12

Improving GPU register file reliability with a comprehensiv..:

Gonçalves, M.M. ; Condia, J.E. Rodriguez ; Reorda, M. Sonza..
Microelectronics Reliability.  114 (2020)  - p. 113768 , 2020
Link: https://doi.org/10.1016/..
 
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13

RESCUE : interdependent challenges of reliability, secur..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
Jenihhin, M. ; Hamdioui, S. ; Reorda, M. Sonza... - p. 388-393 , 2020
Link: https://dl.acm.org/doi/1..
 
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14

On the analysis of radiation-induced failures in the AXI in..:

De Sio, C. ; Azimi, S. ; Sterpone, L.
Microelectronics Reliability.  114 (2020)  - p. 113733 , 2020
Link: https://doi.org/10.1016/..
 
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15

A Novel Propagation Model for Heavy-Ions Induced Single Eve..:

, In: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Du, B. ; Colucci, M. ; Francola, S.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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