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2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Exploring the Reliability Limits for the Z-Pitch Scaling of..:
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2024 IEEE International Memory Workshop (IMW) ,
2
Gate Side Injection Operating Mode for 3D NAND Flash Memori..:
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2023 IEEE International Memory Workshop (IMW) ,
3
Optimization of Retention in Ferroelectricity Boosted Gate ..:
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2021 IEEE International Memory Workshop (IMW) ,
4
First demonstration of ferroelectric Si:HfO2 based 3D FE-FE..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
5
Understanding the kinetics of Metal Induced Lateral Crystal..:
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11
APL, the language and its actuarial applications
Insurance series ; 2
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Zentrale:E02 a inf 331 apl/647