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Stoffel, Dominik
89  Ergebnisse:
Personensuche X
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1

Data-Oblivious and Performant: On Designing Security-Consci..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
Deutschmann, Lucas ; Kazhalawi, Yazan ; Seckinger, Jonathan... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

An Automated Exhaustive Fault Analysis Technique guided by ..:

, In: 2024 25th International Symposium on Quality Electronic Design (ISQED),
Kaja, Endri ; Gerlin, Nicolas ; Zhao, Bihan... - p. 1-8 , 2024
Link: https://doi.org/10.1109/..
 
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3

A Scalable Formal Verification Methodology for Data-Oblivio..:

Deutschmann, Lucas ; Müller, Johannes ; Fadiheh, Mohammad R...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  , 2024
Link: https://doi.org/10.1109/..
 
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4

An Exhaustive Approach to Detecting Transient Execution Sid..:

Fadiheh, Mohammad Rahmani ; Wezel, Alex ; Muller, Johannes...
IEEE Transactions on Computers.  72 (2023)  1 - p. 222-235 , 2023
Link: https://doi.org/10.1109/..
 
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5

Fault Attacks on Access Control in Processors: Threat, Form..:

Duque Antón, Anna L. ; Müller, Johannes ; Fadiheh, Mohammad R...
IEEE Access.  , 2023
Link: https://doi.org/10.1109/..
 
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6

Secure-by-Construction Design Methodology for CPUs: Impleme..:

, In: 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD),
Jauch, Tobias ; Wezel, Alex ; Fadiheh, Mohammad R.... - p. 1-9 , 2023
Link: https://doi.org/10.1109/..
 
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7

A Framework for Formal Verification of DRAM Controllers:

, In: Proceedings of the 2022 International Symposium on Memory Systems,
Steiner, Lukas ; Sudarshan, Chirag ; Jung, Matthias.. - p. 1-7 , 2022
Link: https://dl.acm.org/doi/1..
 
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8

Fast and Accurate Model-Driven FPGA-based System-Level Faul..:

, In: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC),
Kaja, Endri ; Gerlin, Nicolas ; Bora, Monideep... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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9

Towards a formally verified hardware root-of-trust for data..:

, In: Proceedings of the 59th ACM/IEEE Design Automation Conference,
Deutschmann, Lucas ; Müller, Johannes ; Fadiheh, Mohammad R... - p. 727-732 , 2022
Link: https://dl.acm.org/doi/1..
 
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10

Generation of Formal CPU Profiles for Embedded Systems:

, In: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC),
Sorensen, Stian Gerlach ; Bartsch, Christian ; Stoffel, Dominik. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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11

Design of a Tightly-Coupled RISC-V Physical Memory Protecti..:

, In: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC),
Gerlin, Nicolas ; Kaja, Endri ; Bora, Monideep... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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12

MetaFS: Model-driven Fault Simulation Framework:

, In: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Kaja, Endri ; Gerlin, Nicolas ; Bora, Monideep... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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13

Efficient binary-level coverage analysis:

, In: Proceedings of the 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering,
Ben Khadra, M. Ammar ; Stoffel, Dominik ; Kunz, Wolfgang - p. 1153-1164 , 2020
Link: https://dl.acm.org/doi/1..
 
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14

A Formal Approach for Detecting Vulnerabilities to Transien..:

, In: 2020 57th ACM/IEEE Design Automation Conference (DAC),
Fadiheh, Mohammad Rahmani ; Muller, Johannes ; Brinkmann, Raik... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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15

Gap-free Processor Verification by S2QED and Property Gener..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Devarajegowda, Keerthikumara ; Fadiheh, Mohammad Rahmani ; Singh, Eshan... - p. 526-531 , 2020
Link: https://doi.org/10.23919..
 
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