Personensuche
X
?
2024 IEEE 25th Latin American Test Symposium (LATS) ,
1
Data-Oblivious and Performant: On Designing Security-Consci..:
, In:
?
2024 25th International Symposium on Quality Electronic Design (ISQED) ,
2
An Automated Exhaustive Fault Analysis Technique guided by ..:
, In:
?
2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD) ,
6
Secure-by-Construction Design Methodology for CPUs: Impleme..:
, In:
?
Proceedings of the 2022 International Symposium on Memory Systems ,
7
A Framework for Formal Verification of DRAM Controllers:
, In:
?
2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC) ,
8
Fast and Accurate Model-Driven FPGA-based System-Level Faul..:
, In:
?
Proceedings of the 59th ACM/IEEE Design Automation Conference ,
9
Towards a formally verified hardware root-of-trust for data..:
, In:
?
2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC) ,
10
Generation of Formal CPU Profiles for Embedded Systems:
, In:
?
2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC) ,
11
Design of a Tightly-Coupled RISC-V Physical Memory Protecti..:
, In:
?
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
12
MetaFS: Model-driven Fault Simulation Framework:
, In:
?
Proceedings of the 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering ,
13
Efficient binary-level coverage analysis:
, In:
?
2020 57th ACM/IEEE Design Automation Conference (DAC) ,
14
A Formal Approach for Detecting Vulnerabilities to Transien..:
, In:
?
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
15