Sudarshan, Tangali S.
92  Ergebnisse:
Personensuche X
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3

An Approach to Trace Defects Propagation during SiC Epitaxy:

Fan, Ya Ming ; Zhang, Li Guo ; Wang, Jie...
Materials Science Forum.  778-780 (2014)  - p. 147-150 , 2014
 
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4

Study of Surface Morphology, Impurity Incorporation and Def..:

Song, Haizheng ; Chandrashekhar, M. V. S. ; Sudarshan, Tangali S.
ECS Journal of Solid State Science and Technology.  4 (2014)  3 - p. P71-P76 , 2014
 
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5

Large barrier, highly uniform and reproducible Ni-Si/4H-SiC..:

Omar, Sabih U ; Sudarshan, Tangali S ; Rana, Tawhid A..
Journal of Physics D: Applied Physics.  47 (2014)  29 - p. 295102 , 2014
 
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8

Trade-Off between Parasitic Deposition and SiC Homoepitaxia..:

Sudarshan, Tangali S. ; Rana, Tawhid ; Song, Haizheng.
ECS Journal of Solid State Science and Technology.  2 (2013)  8 - p. N3079-N3086 , 2013
 
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