Sunter, Stephen
50  Ergebnisse:
Personensuche X
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3

Analog Fault Simulation - a Hot Topic!:

, In: 2020 IEEE European Test Symposium (ETS),
Sunter, Stephen - p. 1-5 , 2020
 
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4

Efficient Analog Defect Simulation:

, In: 2019 IEEE International Test Conference (ITC),
Sunter, Stephen - p. 1-10 , 2019
 
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6

Contactless Test of IC Pads, Pins, and TSVs via Standard Bo..:

Sunter, Stephen ; Roy, Aubin
IEEE Design & Test of Computers.  29 (2012)  5 - p. 55-62 , 2012
 
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7

Small delay testing for TSVs in 3-D ICs:

, In: Proceedings of the 49th Annual Design Automation Conference,
Huang, Shi-Yu ; Lin, Yu-Hsiang ; Tsai, Kun-Han (Hans)... - p. 1031-1036 , 2012
 
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8

Noise-Insensitive Digital BIST for any PLL or DLL:

Sunter, Stephen ; Roy, Aubin
Journal of Electronic Testing.  24 (2008)  5 - p. 461-472 , 2008
 
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11

Special session: Hot topics: Statistical test methods:

Barragan, Manuel J ; Leger, Gildas ; Azaïs, Florence...
info:eu-repo/semantics/altIdentifier/doi/10.1109/VTS.2015.7116265.  , 2015
 
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12

Special session: Hot topics: Statistical test methods:

Barragan, Manuel J ; Leger, Gildas ; Azaïs, Florence...
info:eu-repo/semantics/altIdentifier/doi/10.1109/VTS.2015.7116265.  , 2015
 
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13

Special session: Hot topics: Statistical test methods:

Barragan, Manuel J ; Leger, Gildas ; Azaïs, Florence...
info:eu-repo/semantics/altIdentifier/doi/10.1109/VTS.2015.7116265.  , 2015
 
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14

Special session: Hot topics: Statistical test methods:

Barragan, Manuel J ; Leger, Gildas ; Azaïs, Florence...
info:eu-repo/semantics/altIdentifier/doi/10.1109/VTS.2015.7116265.  , 2015
 
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