Sydlo, C.
30  Ergebnisse:
Personensuche X
?
1

Overview of SwissFEL dual-photocathode laser capabilities a..:

Bettoni, S. ; Cavalieri, A. ; Dax, A....
High Power Laser Science and Engineering.  9 (2021)  - p. , 2021
 
?
2

Fs level laser-to-RF synchronization at REGAE:

Titberidze, M ; Felber, M ; Lamb, T...
Journal of Physics: Conference Series.  874 (2017)  - p. 012085 , 2017
 
?
 
?
 
?
5

Low-Temperature Grown GaAsSb with Sub-Picosecond Photocarri..:

SIGMUND, J. ; LAMPIN, J.-F. ; IVANNIKOV, V....
IEICE Transactions on Electronics.  E91-C (2008)  7 - p. 1058-1062 , 2008
 
?
6

Generation and spectroscopic application of tunable continu..:

Park, I ; Sydlo, C ; Fischer, I..
Measurement Science and Technology.  19 (2008)  6 - p. 065305 , 2008
 
?
7

Characterization of THz emitter based on a high-speed p-i-n..:

, In: 2007 Joint 32nd International Conference on Infrared and Millimeter Waves and the 15th International Conference on Terahertz Electronics,
Schoenherr, D. ; Sydlo, C. ; Goebel, T.... - p. None , 2007
 
?
8

GaN micromachined FBAR structures for microwave application:

Müller, A. ; Neculoiu, D. ; Vasilache, D....
Superlattices and Microstructures.  40 (2006)  4-6 - p. 426-431 , 2006
 
?
9

Reliability investigations on LTG-GaAs photomixers for THz ..:

Sydlo, C. ; Sigmund, J. ; Mottet, B..
Microelectronics Reliability.  45 (2005)  9-11 - p. 1600-1604 , 2005
 
?
11

Influence of polarization charges in Al0.4Ga0.6N/GaN barrie..:

Saglam, M. ; Mutamba, K. ; Megej, A....
Applied Physics Letters.  82 (2003)  2 - p. 227-229 , 2003
 
?
12

Reliability studies on integrated GaAs power-sensor structu..:

Sydlo, C. ; Mutamba, K. ; Divac Krnic, L...
Microelectronics Reliability.  43 (2003)  9-11 - p. 1929-1933 , 2003
 
?
13

Reliability investigations on HBV using pulsed electrical s..:

Sydlo, C. ; Saglam, M. ; Mottet, B...
Microelectronics Reliability.  42 (2002)  9-11 - p. 1563-1568 , 2002
 
?
14

Defect detection and modelling using pulsed electrical stre..:

Sydlo, C. ; Mottet, B. ; Ganis, H....
Microelectronics Reliability.  41 (2001)  9-10 - p. 1567-1571 , 2001
 
?
15

A method for HBT process control and defect detection using..:

Sydlo, C. ; Mottet, B. ; Schüβler, M...
Microelectronics Reliability.  40 (2000)  8-10 - p. 1449-1453 , 2000
 
1-15