Takahashi, Takuji
789  Ergebnisse:
Personensuche X
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1

Time-resolved electrostatic force microscopy under base-bia..:

Sato, Jo ; Ishibashi, Ryota ; Takahashi, Takuji
Measurement Science and Technology.  35 (2023)  3 - p. 035005 , 2023
 
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2

Accurate Electrostatic Force Measurements by Atomic Force M..:

Fukuzawa, Ryota ; Kobayashi, Daichi ; Takahashi, Takuji
IEEE Transactions on Instrumentation and Measurement.  72 (2023)  - p. 1-8 , 2023
 
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3

Investigation of CsF - Treatment Effects on Cu(In,Ga)(S,Se)..:

, In: 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC),
Yamada, Ayaka ; Takahashi, Takuji - p. 0623-0623 , 2022
 
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4

Peak-tracking scanning capacitance force microscopy with mu..:

Fukuzawa, Ryota ; Takahashi, Takuji
Measurement Science and Technology.  33 (2022)  6 - p. 065405 , 2022
 
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6

Quantitative capacitance measurements in frequency modulati..:

Fukuzawa, Ryota ; Liang, Jianbo ; Shigekawa, Naoteru.
Japanese Journal of Applied Physics.  61 (2022)  SL - p. SL1005 , 2022
 
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7

Time-resolved photo-assisted Kelvin probe force microscopy ..:

Kuroiwa, Tomoe ; Takahashi, Takuji
Japanese Journal of Applied Physics.  61 (2022)  SL - p. SL1004 , 2022
 
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8

Multi-pulse modulation method in photothermal atomic force ..:

Yamada, Ayaka ; Takahashi, Takuji
Japanese Journal of Applied Physics.  60 (2021)  SE - p. SE1003 , 2021
 
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10

Development of dual bias modulation electrostatic force mic..:

Fukuzawa, Ryota ; Takahashi, Takuji
Review of Scientific Instruments.  91 (2020)  2 - p. 023702 , 2020
 
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11

Dual Bias Modulation Electrostatic Force Microscopy on Cu(I..:

, In: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC),
 
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12

Direct imaging method of frequency response of capacitance ..:

Fukuzawa, Ryota ; Takahashi, Takuji
Japanese Journal of Applied Physics.  59 (2020)  7 - p. 078001 , 2020
 
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13

Special issue: Atomically Controlled Surfaces, Interfaces a.. 

Japanese journal of applied physics ; volume 58, number SI (August 2019)
Exemplar:  Zentrale:Magazinturm-E02 15z phy 084 jv/837-58
 
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15

Special issue: scanning probe microscopy 

Japanese journal of applied physics ; volume 57, number 8S1 (August 2018)
Exemplar:  Zentrale:Magazinturm-E02 15z phy 084 jv/837-57
 
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