E-LIB Suche - Ergebnisse für: Takakura, K

1

Ultrathin four-quadrant silicon photodiodes for beam positi..:

Rafí, J.M. ; Quirion, D. ; Duch, M....
Solid-State Electronics. 209 (2023) - p. 108756 , 2023

Link: https://doi.org/10.1016/..

2

Parasitic subthreshold drain current and low frequency nois..:

Takakura, K ; Putcha, V ; Simoen, E...
Semiconductor Science and Technology. 36 (2020) 2 - p. 024003 , 2020

Link: https://doi.org/10.1088/..

3

Health guidance for prevention of lifestyle-related disease..:

Tamura, S ; Haruyama, S ; Ogami, A...
European Journal of Public Health. 30 (2020) Supplement_5 - p. , 2020

Link: https://doi.org/10.1093/..

4

Visceral-to-subcutaneous adipose tissue ratio is a poor pro..:

Yamaguchi, K. ; Wada, M. ; Takakura, K..
Gynecologic Oncology. 154 (2019) - p. 252-253 , 2019

Link: https://doi.org/10.1016/..

5

Four-quadrant silicon and silicon carbide photodiodes for b..:

Rafí, J.M. ; Pellegrini, G. ; Godignon, P....
Journal of Instrumentation. 13 (2018) 1 - p. C01045-C01045 , 2018

Link: https://doi.org/10.1088/..

6

Muon trackers for imaging a nuclear reactor:

Kume, N. ; Miyadera, H. ; Morris, C.L....
Journal of Instrumentation. 11 (2016) 9 - p. P09008-P09008 , 2016

Link: https://doi.org/10.1088/..

7

Non-contrast-enhanced MR angiography of uterine arteries wi..:

Kiguchi, K. ; Kido, A. ; Fujimoto, K....
Clinical Radiology. 69 (2014) 7 - p. 669-673 , 2014

Link: https://doi.org/10.1016/..

8

Remarks on KERMA Factors in ACE files:

Konno, C. ; Ochiai, K. ; Takakura, K..
Nuclear Data Sheets. 118 (2014) - p. 450-452 , 2014

Link: https://doi.org/10.1016/..

9

Impact of electrical stress on the electrical characteristi..:

Rafí, J.M. ; González, M.B. ; Takakura, K....
Solid-State Electronics. 89 (2013) - p. 198-206 , 2013

Link: https://doi.org/10.1016/..

10

2 MeV electron irradiation effects on bulk and interface of..:

García, H. ; Castán, H. ; Dueñas, S....
Thin Solid Films. 534 (2013) - p. 482-487 , 2013

Link: https://doi.org/10.1016/..

11

2 MeV electron irradiation effects on the electrical charac..:

Rafí, J.M. ; Campabadal, F. ; Ohyama, H....
Solid-State Electronics. 79 (2013) - p. 65-74 , 2013

Link: https://doi.org/10.1016/..

12

2MeV electron irradiation effects on the electrical charact..:

Rafí, J.M. ; González, M.B. ; Takakura, K....
Microelectronics Reliability. 53 (2013) 9-11 - p. 1333-1337 , 2013

Link: https://doi.org/10.1016/..

13

Radiation damage of Si1-xGex S/D p-type metal oxide semicon..:

Nakashima, T. ; Idemoto, T. ; Tsunoda, I....
Thin Solid Films. 520 (2012) 8 - p. 3337-3340 , 2012

Link: https://doi.org/10.1016/..

14

Measurement of Reaction Rates in Li/V-Alloy Assembly with 1..:

Tanaka, T. ; Sato, S. ; Kondo, K....
Fusion Science and Technology. 60 (2011) 2 - p. 681-686 , 2011

Link: https://doi.org/10.13182..

15

Damages of Ge devices by 2-MeV electrons and their recovery:

Ohyama, H. ; Sakamoto, K. ; Sukizaki, H....
Microelectronic Engineering. 88 (2011) 4 - p. 480-483 , 2011

Link: https://doi.org/10.1016/..