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Talukdar, Jagritee
26  Ergebnisse:
Personensuche X
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1

Performance improvement of trap charge infused MoS2 based T..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Talukdar, Jagritee ; Muralidharan, Bhaskaran - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
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2

Analysis of noise behavior and reliability of pocket doped ..:

Malvika ; Talukdar, Jagritee ; Choudhuri, Bijit.
Microelectronics Reliability.  152 (2024)  - p. 115301 , 2024
Link: https://doi.org/10.1016/..
 
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3

Source engineered TFET for digital inverters application:

Talukdar, Jagritee ; Malvika ; Das, Basab..
Physica Scripta.  99 (2024)  4 - p. 045026 , 2024
Link: https://doi.org/10.1088/..
 
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4

Performance analysis of optically gated MoS2 photosensor fo..:

Talukdar, Jagritee ; Muralidharan, Bhaskaran
IEEE Sensors Journal.  , 2024
Link: https://doi.org/10.1109/..
 
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5

Exploration of Graphene as Emerging 2D Material and Its App..:

, In: Proceedings of 4th International Conference on Frontiers in Computing and Systems; Lecture Notes in Networks and Systems,
Malvika ; Talukdar, Jagritee ; Choudhuri, Bijit.. - p. 719-731 , 2024
Link: https://doi.org/10.1007/..
 
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6

Comparative Analysis of Noise Behavior of Highly Doped Doub..:

Malvika ; Talukdar, Jagritee ; Kumar, Vivek..
Journal of Electronic Materials.  52 (2023)  9 - p. 6203-6215 , 2023
Link: https://doi.org/10.1007/..
 
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7

Design and Implementation of an Optimized High-Speed Vedic-..:

, In: Lecture Notes in Electrical Engineering; Micro and Nanoelectronics Devices, Circuits and Systems,
Halder, Saurabh ; Saha, Mihir Lal ; Malvika.. - p. 287-297 , 2023
Link: https://doi.org/10.1007/..
 
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8

A Simulation Study of the Effect of Trap Charges and Temper..:

Nikhil, Korra ; Babu, K Murali Chandra ; Talukdar, Jagritee.
Silicon.  16 (2023)  2 - p. 525-534 , 2023
Link: https://doi.org/10.1007/..
 
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9

Highly sensitivity Non-Uniform Tunnel FET based biosensor u..:

Talukdar, Jagritee ; Rawat, Gopal ; Mummaneni, Kavicharan
Materials Science and Engineering: B.  293 (2023)  - p. 116455 , 2023
Link: https://doi.org/10.1016/..
 
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10

Noise behavior and reliability analysis of non-uniform body..:

Talukdar, Jagritee ; Rawat, Gopal ; Mummaneni, Kavicharan
Microelectronics Reliability.  131 (2022)  - p. 114510 , 2022
Link: https://doi.org/10.1016/..
 
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11

Sensitivity analysis of Non-uniform TFET with dual material..:

, In: 2022 IEEE International Symposium on Smart Electronic Systems (iSES),
Talukdar, Jagritee ; Malvika, Malvika ; Das, Basab. - p. 597-600 , 2022
Link: https://doi.org/10.1109/..
 
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12

Analytical modeling and TCAD simulation for subthreshold ch..:

Talukdar, Jagritee ; Rawat, Gopal ; Mummaneni, Kavicharan
Materials Science in Semiconductor Processing.  142 (2022)  - p. 106482 , 2022
Link: https://doi.org/10.1016/..
 
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13

Source pocket-engineered hetero-gate dielectric SOI Tunnel ..:

Sharma, Vanshaj ; Kumar, Sanjay ; Talukdar, Jagritee..
Materials Science in Semiconductor Processing.  143 (2022)  - p. 106541 , 2022
Link: https://doi.org/10.1016/..
 
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14

Design and Analysis of Non-uniform Body with Dual Material ..:

, In: Lecture Notes in Electrical Engineering; Micro and Nanoelectronics Devices, Circuits and Systems,
Talukdar, Jagritee ; Mummaneni, Kavicharan - p. 159-165 , 2022
Link: https://doi.org/10.1007/..
 
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15

A simulation study of the effect of ferroelectric thickness..:

, In: 2022 IEEE International Symposium on Smart Electronic Systems (iSES),
Malvika, Malvika ; Talukdar, Jagritee ; Choudhuri, Bijit. - p. 601-604 , 2022
Link: https://doi.org/10.1109/..
 
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