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Talukdar, Jonti
18  Ergebnisse:
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1

Rowhammer Vulnerability of DRAMs in 3-D Integration:

Ortega, Eduardo ; Talukdar, Jonti ; Paik, Woohyun..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  32 (2024)  5 - p. 967-971 , 2024
Link: https://doi.org/10.1109/..
 
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2

TaintLock: Hardware IP Protection Against Oracle-Guided and..:

Talukdar, Jonti ; Chaudhuri, Arjun ; Ortega, Eduardo.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  , 2024
Link: https://doi.org/10.1109/..
 
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3

ALT-Lock: Logic and Timing Ambiguity-Based IP Obfuscation A..:

Talukdar, Jonti ; Paik, Woo-Hyun ; Ortega, Eduardo.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  32 (2024)  8 - p. 1535-1548 , 2024
Link: https://doi.org/10.1109/..
 
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4

Detection of Voltage Droop-Induced Timing Fault Attacks Due..:

Talukdar, Jonti ; Vyas, Akshay ; Chakrabarty, Krishnendu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  , 2024
Link: https://doi.org/10.1109/..
 
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5

Securing Heterogeneous 2.5D ICs Against IP Theft through Dy..:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Talukdar, Jonti ; Chaudhuri, Arjun ; Kim, Jinwoo.. - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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6

Simply-Track-and-Refresh: Efficient and Scalable Rowhammer ..:

, In: 2023 IEEE International Test Conference (ITC),
Ortega, Eduardo ; Bletsch, Tyler ; Joardar, Biresh... - p. 340-349 , 2023
Link: https://doi.org/10.1109/..
 
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7

Functional Test Generation for AI Accelerators using Bayesi..:

, In: 2023 IEEE 41st VLSI Test Symposium (VTS),
Chaudhuri, Arjun ; Chen, Ching-Yuan ; Talukdar, Jonti. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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8

TaintLock: Preventing IP Theft through Lightweight Dynamic ..:

, In: 2022 IEEE European Test Symposium (ETS),
Talukdar, Jonti ; Chaudhuri, Arjun ; Chakrabarty, Krishnendu - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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9

Automatic Structural Test Generation for Analog Circuits us..:

, In: 2022 IEEE International Test Conference (ITC),
Talukdar, Jonti ; Chaudhuri, Arjun ; Bhattacharya, Mayukh. - p. 145-154 , 2022
Link: https://doi.org/10.1109/..
 
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10

Machine Learning for Testing Machine-Learning Hardware :..:

, In: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design,
Chaudhuri, Arjun ; Talukdar, Jonti ; Chakrabarty, Krishnendu - p. 1-6 , 2022
Link: https://dl.acm.org/doi/1..
 
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11

Special Session: Fault Criticality Assessment in AI Acceler..:

, In: 2022 IEEE 40th VLSI Test Symposium (VTS),
Chaudhuri, Arjun ; Talukdar, Jonti ; Chakrabarty, Krishnendu - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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12

Probabilistic Fault Grading for AI Accelerators using Neura..:

, In: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI),
Chaudhuri, Arjun ; Talukdar, Jonti ; Chakrabarty, Krishnendu - p. 333-338 , 2022
Link: https://doi.org/10.1109/..
 
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13

A BIST-based Dynamic Obfuscation Scheme for Resilience agai..:

, In: 2021 IEEE International Test Conference (ITC),
Talukdar, Jonti ; Chen, Siyuan ; Das, Amitabh... - p. 170-179 , 2021
Link: https://doi.org/10.1109/..
 
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14

Functional Criticality Classification of Structural Faults ..:

, In: 2020 IEEE International Test Conference (ITC),
Chaudhuri, Arjun ; Talukdar, Jonti ; Su, Fei. - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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15

Computational Intelligence in Embedded System Design: A Rev..:

, In: Information and Communication Technology for Intelligent Systems; Smart Innovation, Systems and Technologies,
Talukdar, Jonti ; Mehta, Bhavana ; Gajjar, Sachin - p. 473-484 , 2018
Link: https://doi.org/10.1007/..
 
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