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2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
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Securing Heterogeneous 2.5D ICs Against IP Theft through Dy..:
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2023 IEEE International Test Conference (ITC) ,
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Simply-Track-and-Refresh: Efficient and Scalable Rowhammer ..:
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2023 IEEE 41st VLSI Test Symposium (VTS) ,
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Functional Test Generation for AI Accelerators using Bayesi..:
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2022 IEEE European Test Symposium (ETS) ,
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TaintLock: Preventing IP Theft through Lightweight Dynamic ..:
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2022 IEEE International Test Conference (ITC) ,
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Automatic Structural Test Generation for Analog Circuits us..:
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Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design ,
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Machine Learning for Testing Machine-Learning Hardware :..:
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2022 IEEE 40th VLSI Test Symposium (VTS) ,
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Special Session: Fault Criticality Assessment in AI Acceler..:
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2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ,
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Probabilistic Fault Grading for AI Accelerators using Neura..:
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2021 IEEE International Test Conference (ITC) ,
13
A BIST-based Dynamic Obfuscation Scheme for Resilience agai..:
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2020 IEEE International Test Conference (ITC) ,
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Functional Criticality Classification of Structural Faults ..:
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Information and Communication Technology for Intelligent Systems; Smart Innovation, Systems and Technologies ,
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