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Proceedings of the 28th Asia and South Pacific Design Automation Conference ,
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A Low-Bitwidth Integer-STBP Algorithm for Efficient Trainin..:
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2022 IEEE International Test Conference (ITC) ,
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Improving Test Quality of Memory Chips by a Decision Tree-B..:
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2022 IEEE International Test Conference in Asia (ITC-Asia) ,
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A Decision Tree-Based Screening Method for Improving Test Q..:
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2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ,
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A Memory Built-In Peer-Repair Architecture for Mesh-Connect..:
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2022 IEEE International Test Conference in Asia (ITC-Asia) ,
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Weak Die Screening by Feature Prioritized Random Forest for..:
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Proceedings of the 57th ACM/EDAC/IEEE Design Automation Conference ,
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A 90nm 103.14 TOPS/W binary-weight spiking neural network C..:
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2020 57th ACM/IEEE Design Automation Conference (DAC) ,
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