E-LIB Suche - Ergebnisse für: Tempez, A.

1

Electronic defect study on low temperature processed Cu(In,..:

Van Puyvelde, L ; Lauwaert, J ; Tempez, A...
Journal of Physics D: Applied Physics. 48 (2015) 17 - p. 175104 , 2015

Link: https://doi.org/10.1088/..

2

Passivation behaviour of 304 stainless steel in an ionic li..:

Molchan, I.S. ; Thompson, G.E. ; Walton, J....
Applied Surface Science. 357 (2015) - p. 37-44 , 2015

Link: https://doi.org/10.1016/..

3

Chemical analysis of Cd1−xZnxS/CdTe solar cells by plasma p..:

Kartopu, G. ; Tempez, A. ; Clayton, A. J....
Materials Research Innovations. 18 (2014) 2 - p. 82-85 , 2014

Link: https://doi.org/10.1179/..

4

P2IMS depth profile analysis of high temperature boron oxyn..:

Badi, N. ; Vijayaraghavan, S. ; Benqaoula, A....
Applied Surface Science. 292 (2014) - p. 1-4 , 2014

Link: https://doi.org/10.1016/..

5

Depth-profile analysis of thermoelectric layers on Si wafer..:

Reinsberg, K.-G. ; Schumacher, C. ; Tempez, A...
Spectrochimica Acta Part B: Atomic Spectroscopy. 76 (2012) - p. 175-180 , 2012

Link: https://doi.org/10.1016/..

6

Physico-chemical processes occurring during polymerization ..:

Groza, A. ; Surmeian, A. ; Diplasu, C....
Surface and Coatings Technology. 212 (2012) - p. 145-151 , 2012

Link: https://doi.org/10.1016/..

7

18O distributions in porous anodic alumina by plasma profil..:

Baron Wiecheć, A. ; Tempez, A. ; Skeldon, P...
Surface and Interface Analysis. 44 (2012) 10 - p. 1346-1352 , 2012

Link: https://doi.org/10.1002/..

8

A purged argon pre-chamber for analytical glow discharge—ti..:

Lobo, L. ; Bordel, N. ; Pereiro, R....
J. Anal. At. Spectrom.. 26 (2011) 4 - p. 798-803 , 2011

Link: https://doi.org/10.1039/..

9

Depth profiling analysis of barrier‐type anodic aluminium o..:

Trigoulet, N. ; Tuccitto, N. ; Delfanti, I....
Surface and Interface Analysis. 43 (2011) 1-2 - p. 183-186 , 2011

Link: https://doi.org/10.1002/..

10

Quantitative depth profile analysis of boron implanted sili..:

Pisonero, J. ; Lobo, L. ; Bordel, N....
Solar Energy Materials and Solar Cells. 94 (2010) 8 - p. 1352-1357 , 2010

Link: https://doi.org/10.1016/..

11

Differentiation of 18O‐ and 16O‐rich layers in anodic alumi..:

Molchan, I. S. ; Thompson, G. E. ; Skeldon, P....
Surface and Interface Analysis. 42 (2010) 4 - p. 211-214 , 2010

Link: https://doi.org/10.1002/..

12

Analysis of thin impurity doped layers in anodic alumina an..:

Molchan, I. S. ; Thompson, G. E. ; Skeldon, P....
Transactions of the IMF. 88 (2010) 3 - p. 154-157 , 2010

Link: https://doi.org/10.1179/..

13

Surface topography effects on glow discharge depth profilin..:

Trigoulet, N. ; Hashimoto, T. ; Molchan, I. S....
Surface and Interface Analysis. 42 (2010) 4 - p. 328-333 , 2010

Link: https://doi.org/10.1002/..

14

Direct chemical in-depth profile analysis and thickness qua..:

Valledor, R. ; Pisonero, J. ; Bordel, N....
Analytical and Bioanalytical Chemistry. 396 (2010) 8 - p. 2881-2887 , 2010

Link: https://doi.org/10.1007/..

15

Polymer screening by radiofrequency glow discharge time-of-..:

Lobo, L. ; Tuccitto, N. ; Bordel, N....
Analytical and Bioanalytical Chemistry. 396 (2010) 8 - p. 2863-2869 , 2010

Link: https://doi.org/10.1007/..