E-LIB Suche - Ergebnisse für: Templier, F

1

16.2: Invited Paper: Challenges and solutions for High‐perf..:

Templier, F. ; Bernard, J. ; Caplet, S...
SID Symposium Digest of Technical Papers. 50 (2019) S1 - p. 164-166 , 2019

Link: https://doi.org/10.1002/..

2

18‐3: A New Approach for Fabricating High‐Performance Micro..:

Templier, F. ; Bernard, J.
SID Symposium Digest of Technical Papers. 50 (2019) 1 - p. 240-243 , 2019

Link: https://doi.org/10.1002/..

3

25.2: Invited Paper: Active‐matrix, WVGA GaN Led microdispl..:

Templier, F. ; Dupré, L. ; Daami, A..
SID Symposium Digest of Technical Papers. 49 (2018) S1 - p. 271-271 , 2018

Link: https://doi.org/10.1002/..

4

Hysteresis effect in bottom-gate polymorphous silicon thin-..:

Hastas, N.A. ; Arpatzanis, N. ; Dimitriadis, C.A....
Microelectronics Reliability. 51 (2011) 3 - p. 556-559 , 2011

Link: https://doi.org/10.1016/..

5

Mechanical failure analysis of thin film transistor devices..:

Leterrier, Y. ; Pinyol, A. ; Gilliéron, D....
Engineering Fracture Mechanics. 77 (2010) 4 - p. 660-670 , 2010

Link: https://doi.org/10.1016/..

6

Characterization of traps in the gate dielectric of amorpho..:

Ioannidis, E. G. ; Tsormpatzoglou, A. ; Tassis, D. H....
Journal of Applied Physics. 108 (2010) 10 - p. , 2010

Link: https://doi.org/10.1063/..

7

"Hump" characteristics and edge effects in polysilicon thin..:

Valletta, A. ; Gaucci, P. ; Mariucci, L...
Journal of Applied Physics. 104 (2008) 12 - p. , 2008

Link: https://doi.org/10.1063/..

8

Two dimensional simulation and modeling of the electrical b..:

Archontas, N. ; Georgoulas, N. ; Dimitriadis, C. A....
Journal of Applied Physics. 103 (2008) 10 - p. , 2008

Link: https://doi.org/10.1063/..

9

Degradation of n-channel a-Si:H/nc-Si:H bilayer thin-film t..:

Arpatzanis, N. ; Hatzopoulos, A.T. ; Tassis, D.H....
Microelectronics Reliability. 48 (2008) 4 - p. 531-536 , 2008

Link: https://doi.org/10.1016/..

10

Stability of n-channel a-Si:H∕nc-Si:H bilayer thin-film tra..:

Hatzopoulos, A. T. ; Tassis, D. H. ; Arpatzanis, N....
Journal of Applied Physics. 103 (2008) 8 - p. , 2008

Link: https://doi.org/10.1063/..

11

Mechanical integrity analysis of multilayer insulator coati..:

Plojoux, J. ; Leterrier, Y. ; Månson, J.-A.E..
Thin Solid Films. 515 (2007) 17 - p. 6890-6898 , 2007

Link: https://doi.org/10.1016/..

12

1/f noise characterization of amorphous/nanocrystalline sil..:

Hatzopoulos, A.T. ; Arpatzanis, N. ; Tassis, D.H....
Solid-State Electronics. 51 (2007) 5 - p. 726-731 , 2007

Link: https://doi.org/10.1016/..

13

Polysilicon high frequency devices for large area electroni..:

Botrel, J.L. ; Savry, O. ; Rozeau, O...
Thin Solid Films. 515 (2007) 19 - p. 7422-7427 , 2007

Link: https://doi.org/10.1016/..

14

Electrical stability in self-aligned p-channel polysilicon ..:

Gaucci, P. ; Mariucci, L. ; Valletta, A....
Thin Solid Films. 515 (2007) 19 - p. 7571-7575 , 2007

Link: https://doi.org/10.1016/..

15

Above-threshold drain current model including band tail sta..:

Pappas, I. ; Dimitriadis, C. A. ; Templier, F...
Journal of Applied Physics. 101 (2007) 8 - p. , 2007

Link: https://doi.org/10.1063/..