Theodorou, Christoforos
239  Ergebnisse:
Personensuche X
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1

Static and LFN/RTN Local and Global Variability Analysis Us..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
 
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3

1/f and Random Telegraph Noise of Single-Layer Graphene Dev..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
 
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4

The Role of Tunneling Oxide in the Low Frequency Noise of M..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
 
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5

Drain Current Variability in 2-levels Stacked Nanowire Gate..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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6

Negative Differential Interlayer Resistance in WSe2 Multila..:

Han, Yeongseo ; Chae, Minji ; Choi, Dahyun...
ACS Applied Materials & Interfaces.  15 (2023)  50 - p. 58605-58612 , 2023
 
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7

Experimental Evidence of Light Source Contribution in the N..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
 
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9

Probing hidden conduction mechanisms in diced silicon solar..:

Wulles, Chloé ; Rafhay, Quentin ; Desrues, Thibaut..
Solar Energy Materials and Solar Cells.  256 (2023)  - p. 112344 , 2023
 
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10

Applicability of the Carrier Number Fluctuations Model for ..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
 
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13

In-depth electrical characterization of deca-nanometer InGa..:

, In: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC),
 
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15

Accounting for Current Degradation Effects in the Compact N..:

, In: 2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST),
 
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