E-LIB Suche - Ergebnisse für: Thi Nguyen, Cam Phu

1

Damage to passivation contact in silicon heterojunction sol..:

Le, Anh Huy Tuan ; Dao, Vinh Ai ; Pham, Duy Phong...
Solar Energy Materials and Solar Cells. 192 (2019) - p. 36-43 , 2019

Link: https://doi.org/10.1016/..

2

Corrigendum to 'Enhanced electrical properties of oxide sem..:

Thi Nguyen, Cam Phu ; Raja, Jayapal ; Kim, Sunbo...
Applied Surface Science. 469 (2019) - p. 1016 , 2019

Link: https://doi.org/10.1016/..

3

Effects of tunneling dielectrics formed by CO2 and N2O plas..:

Jang, Kyungsoo ; Lee, Sojin ; Nguyen, Thi Cam Phu...
Semiconductor Science and Technology. 33 (2018) 12 - p. 125004 , 2018

Link: https://doi.org/10.1088/..

4

Microscopic and nanoscale mechanical properties of tonkin c..:

Nguyen, Cam-Phu Thi ; Schoenherr, Peggy ; Seidel, Jan
Cellulose. 31 (2024) 3 - p. 1417-1427 , 2024

Link: https://doi.org/10.1007/..

5

Crackling noise microscopy:

Nguyen, Cam-Phu Thi ; Schoenherr, Peggy ; Salje, Ekhard K. H..
Nature Communications. 14 (2023) 1 - p. , 2023

Link: https://doi.org/10.1038/..

6

In-depth atomic force microscopy investigation of nanoscale..:

Nguyen, Cam-Phu Thi ; Schoenherr, Peggy ; Juli, Lyman.
Nanoscale. 13 (2021) 40 - p. 16959-16967 , 2021

Link: https://doi.org/10.1039/..

7

Improvement of the storage ability of Si-rich oxide layer i..:

Nguyen, Cam Phu Thi ; Manh, Tran Dinh ; Le, Anh Huy Tuan...
Semiconductor Science and Technology. 34 (2019) 9 - p. 095020 , 2019

Link: https://doi.org/10.1088/..

8

On the origin of the changes in the opto-electrical propert..:

Le, Anh Huy Tuan ; Kim, Youngkuk ; Lee, Youn-Jung...
Applied Surface Science. 433 (2018) - p. 798-805 , 2018

Link: https://doi.org/10.1016/..

9

Enhanced electrical properties of oxide semiconductor thin-..:

Nguyen, Cam Phu Thi ; Raja, Jayapal ; Kim, Sunbo...
Applied Surface Science. 396 (2017) - p. 1472-1477 , 2017

Link: https://doi.org/10.1016/..

10

High performance non-volatile memory with the control of ch..:

Nguyen, Cam Phu Thi ; Trinh, Thanh Thuy ; Raja, Jayapal...
Semiconductor Science and Technology. 30 (2015) 7 - p. 075009 , 2015

Link: https://doi.org/10.1088/..

11

Source/drain metallization effects on the specific contact ..:

Nguyen, Cam Phu Thi ; Trinh, Thanh Thuy ; Raja, Jayapal...
Materials Science in Semiconductor Processing. 39 (2015) - p. 649-653 , 2015

Link: https://doi.org/10.1016/..

12

A statistical approach for the optimization of indium tin o..:

Le, Anh Huy Tuan ; Ahn, Shihyun ; Kim, Sangho...
Energy Conversion and Management. 87 (2014) - p. 191-198 , 2014

Link: https://doi.org/10.1016/..

13

Effective optimization of indium tin oxide films by a stati..:

Huy Tuan Le, Anh ; Ahn, Shihyun ; Han, Sangmyeong...
Solar Energy Materials and Solar Cells. 125 (2014) - p. 176-183 , 2014

Link: https://doi.org/10.1016/..

14

Bias–stress-induced threshold voltage shift dependence of n..:

Nguyen, Cam Phu Thi ; Trinh, Thanh Thuy ; Dao, Vinh Ai...
Semiconductor Science and Technology. 28 (2013) 10 - p. 105014 , 2013

Link: https://doi.org/10.1088/..

15

Effects of interface trap density on the electrical perform..:

Liang, Yongye ; Kyungsoo, Jang ; Velumani, S...
Journal of Semiconductors. 36 (2015) 2 - p. 024007 , 2015

Link: https://doi.org/10.1088/..