Thonnart, Yvain
101  Ergebnisse:
Personensuche X
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1

A 7.4μW and 860μm2per Channel Cryo-CMOS IC for 70-Channel F..:

, In: 2024 IEEE Custom Integrated Circuits Conference (CICC),
 
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4

Process Integration of Photonic Interposer for Chiplet-base..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
 
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6

A Cryogenic Active Router for Qubit Array Biasing from DC t..:

, In: ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC),
Jadot, Baptiste ; Zurita, Marcos ; Billiot, Gerard... - p. 157-160 , 2023
 
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7

Architecting Optically Controlled Phase Change Memory:

Narayan, Aditya ; Thonnart, Yvain ; Vivet, Pascal..
ACM Transactions on Architecture and Code Optimization.  19 (2022)  4 - p. 1-26 , 2022
 
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9

SE2: Going Remote: Challenges and Opportunities to Remote L..:

, In: 2021 IEEE International Solid-State Circuits Conference (ISSCC),
Klinefelter, Alicia ; Liu, Huichu ; Benini, Luca... - p. 539-540 , 2021
 
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10

Designing a Multi-Chiplet Manycore System using the POPSTAR..:

, In: 2021 ACM/IEEE International Workshop on System Level Interconnect Prediction (SLIP),
Thonnart, Yvain - p. 42-42 , 2021
 
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11

19.2 A 110mK 295µW 28nm FDSOI CMOS Quantum Integrated Circu..:

, In: 2020 IEEE International Solid- State Circuits Conference - (ISSCC),
Guevel, Loick Le ; Billiot, Gerard ; Jehl, Xavier... - p. 306-308 , 2020
 
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12

System-level Evaluation of Chip-Scale Silicon Photonic Netw..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Narayan, Aditya ; Thonnart, Yvain ; Vivet, Pascal.. - p. 1444-1449 , 2020
 
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13

System-level evaluation of chip-scale silicon photonic netw..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
Narayan, Aditya ; Thonnart, Yvain ; Vivet, Pascal.. - p. 1444-1449 , 2020
 
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14

POPSTAR : a robust modular optical NoC architecture for ..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
 
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15

POPSTAR: a Robust Modular Optical NoC Architecture for Chip..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Thonnart, Yvain ; Bernabe, Stephane ; Charbonnier, Jean... - p. 1456-1461 , 2020
 
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