E-LIB Suche - Ergebnisse für: Tian, Xiaorang

1

Performance degradation and reliability technology of high-..:

Ge, Huayun ; Li, Xing ; Tian, Xiaorang...
The International Journal of Advanced Manufacturing Technology. , 2024

Link: https://doi.org/10.1007/..

2

Influence of backside surface morphology on passivation and..:

Guo, Chunlin ; Jia, Rui ; Li, Xing...
Solar Energy. 258 (2023) - p. 278-288 , 2023

Link: https://doi.org/10.1016/..

3

Study on the influence of micro-alkali texturing and micro-..:

Guo, Chunlin ; Jia, Rui ; Tian, Xiaorang...
Solar Energy Materials and Solar Cells. 260 (2023) - p. 112476 , 2023

Link: https://doi.org/10.1016/..

4

The effect of silicon films impurity compensation on the pe..:

Luo, Wei ; Jia, Rui ; Wang, Longjie...
Microelectronics Journal. 138 (2023) - p. 105856 , 2023

Link: https://doi.org/10.1016/..

5

Effect of bias conditions on transient anode current for qu..:

Wang, Longjie ; Luo, Wei ; Zhang, Mingpeng...
Microelectronics Journal. 136 (2023) - p. 105801 , 2023

Link: https://doi.org/10.1016/..

6

Influence of material type and surface roughness of substra..:

Tian, Xiaorang ; Meng, Chuizhou ; Zhao, Xin...
Vacuum. 187 (2021) - p. 110091 , 2021

Link: https://doi.org/10.1016/..

7

Pyramid size control and morphology treatment for high-effi..:

Tian, Xiaorang ; Han, Peide ; Zhao, Guanchao...
Journal of Semiconductors. 40 (2019) 3 - p. 032703 , 2019

Link: https://doi.org/10.1088/..

8

Minority Carrier Lifetime of n-type Mono-crystalline Silico..:

Xu, Han ; Tian, Xiaorang
Energy Procedia. 92 (2016) - p. 708-714 , 2016

Link: https://doi.org/10.1016/..

9

Achieving High Minority Carrier Lifetime through Low-Temper..:

Tian, Xiaorang ; Gu, Shibin ; Mao, Weiping...
ECS Transactions. 60 (2014) 1 - p. 1267-1272 , 2014

Link: https://doi.org/10.1149/..

10

The exploration of making acidproof fracturing proppants us..:

Tian, Xiaorang ; Wu, Bolin ; Li, Jian
Journal of Hazardous Materials. 160 (2008) 2-3 - p. 589-593 , 2008

Link: https://doi.org/10.1016/..

11

Experimental study on edge energetic electrons in EXL-50 sp..:

Guo, Dong ; Shi, Yuejiang ; Liu, Wenjun...
http://arxiv.org/abs/2112.10315. , 2021

Link: http://arxiv.org/abs/211..

12

Influence of material type and surface roughness of substra..:

Tian, Xiaorang ; Meng, Chuizhou ; Zhao, Xin...
VACUUM. , 2021

Link: http://ir.semi.ac.cn/han..

13

Characterization of the defect in CIGSe solar cell by admit..:

Jiwu Zhu ; Rui Jia ; Xiaorang Tian...
http://dx.doi.org/10.1063/5.0141107. , 2023

Link: https://doi.org/10.1063/..