Tjeertes, D.
60  Ergebnisse:
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Atomic scale analysis of N dopants in InAs:

Verstijnen, T.J.F ; Tjeertes, D ; Banfi, E.G..
https://eprints.lancs.ac.uk/id/eprint/202900/1/2023_InAsN_manuscript_20230605.pdf.  , 2023
 
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Atomic scale study of Si-doped AlAs by cross-sectional scan..:

Tjeertes, D ; Vela, A ; Verstijnen, T.J.F...
Tjeertes , D , Vela , A , Verstijnen , T J F , Banfi , E G , Veldhoven , P J V , Menezes , M G , de Janeiro , U F D , Koiller , B & Koenraad , P M 2021 , ' Atomic scale study of Si-doped AlAs by cross-sectional scanning tunneling microscopy and density functional theory ' , Physical Review B , vol. 104 , no. 12 , 125433 . https://doi.org/10.1103/PhysRevB.104.125433.  , 2021
 
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N-nH complexes in GaAs studied at the atomic scale by cross..:

Tjeertes, D ; Verstijnen, TJF ; Gonzalo, A...
info:eu-repo/semantics/altIdentifier/wos/WOS:000568191200004.  , 2020
 
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