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Tokunaga, Carlos
41  Ergebnisse:
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1

A 100-Gbps Fault-Injection Attack-Resistant AES-256 Engine ..:

Kumar, Raghavan ; Varna, Avinash L. ; Tokunaga, Carlos...
IEEE Journal of Solid-State Circuits.  59 (2024)  1 - p. 79-89 , 2024
Link: https://doi.org/10.1109/..
 
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2

Measurement of Aging Effect in a Digitally Controlled Induc..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Zhang, Shida ; Rahman, Nael Mizanur ; Wang, Wei-Chun... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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3

15.5 A 100Gbps Fault-Injection Attack Resistant AES-256 Eng..:

, In: 2023 IEEE International Solid- State Circuits Conference (ISSCC),
Kumar, Raghavan ; Varna, Avinash ; Tokunaga, Carlos... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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4

An Eight-Core RISC-V Processor With Compute Near Last Level..:

Chen, Gregory K. ; Knag, Phil C. ; Tokunaga, Carlos.
IEEE Journal of Solid-State Circuits.  58 (2023)  4 - p. 1117-1128 , 2023
Link: https://doi.org/10.1109/..
 
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5

Improving compute in-memory ECC reliability with successive..:

, In: Proceedings of the 59th ACM/IEEE Design Automation Conference,
Crafton, Brian ; Wan, Zishen ; Spetalnick, Samuel... - p. 745-750 , 2022
Link: https://dl.acm.org/doi/1..
 
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6

An 8-core RISC-V Processor with Compute near Last Level Cac..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Chen, Gregory K. ; Knag, Phil C. ; Tokunaga, Carlos. - p. 68-69 , 2022
Link: https://doi.org/10.1109/..
 
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7

Analysis of the Effect of Hot Carrier Injection in An Integ..:

, In: Proceedings of the ACM/IEEE International Symposium on Low Power Electronics and Design,
Zhang, Shida ; Mizanur Rahman, Nael ; Chekuri, Venkata Chaitanya Krishna.. - p. 1-6 , 2022
Link: https://dl.acm.org/doi/1..
 
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8

A Back-Sampling Chain Technique for Accelerated Detection, ..:

Kumar, Saurabh ; Cho, Minki ; Everson, Luke R....
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  29 (2021)  12 - p. 2086-2097 , 2021
Link: https://doi.org/10.1109/..
 
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9

An Energy-Efficient Graphics Processor in 14-nm Tri-Gate CM..:

Meinerzhagen, Pascal A. ; Tokunaga, Carlos ; Malavasi, Andres...
IEEE Journal of Solid-State Circuits.  54 (2019)  1 - p. 144-157 , 2019
Link: https://doi.org/10.1109/..
 
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10

Session details: Hardware Security:

, In: Proceedings of the 2016 International Symposium on Low Power Electronics and Design,
Gu, Jie ; Tokunaga, Carlos , 2016
Link: https://dl.acm.org/doi/1..
 
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11

4.7 A 409GOPS/W adaptive and resilient domino register file..:

, In: 2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers,
Kulkarni, Jaydeep P. ; Tokunaga, Carlos ; Aseron, Paolo... - p. 1-3 , 2015
Link: https://doi.org/10.1109/..
 
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12

Adaptive and Resilient Circuits for Dynamic Variation Toler..:

Bowman, Keith A. ; Tokunaga, Carlos ; Tschanz, James W...
IEEE Design & Test.  30 (2013)  6 - p. 8-17 , 2013
Link: https://doi.org/10.1109/..
 
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13

Design for test and reliability in ultimate CMOS:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Nicolaidis, Michael ; Anghel, Lorena ; Zorian, Yervant... - p. 677-682 , 2012
Link: https://dl.acm.org/doi/1..
 
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14

Resilient microprocessor design for high performance & ener..:

, In: Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design,
Bowman, Keith A. ; Tschanz, James W. ; Lu, Shih-Lien L.... - p. 355-356 , 2010
Link: https://dl.acm.org/doi/1..
 
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15

Dynamic variation monitor for measuring the impact of volta..:

, In: IEEE Custom Integrated Circuits Conference 2010,
Bowman, Keith ; Tokunaga, Carlos ; Tschanz, James... - p. 1-4 , 2010
Link: https://doi.org/10.1109/..
 
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