E-LIB Suche - Ergebnisse für: Torres, Alphonse

1

XPS study of a selective GaN etching process using self-lim..:

Le Roux, Frédéric ; Possémé, Nicolas ; Burtin, Pauline..
Microelectronic Engineering. 228 (2020) - p. 111328 , 2020

Link: https://doi.org/10.1016/..

2

(Invited) Epitaxy of GaN on Si (111) for Power Electronics,..:

Charles, Matthew ; Kanyandekwe, Joël ; Bos, Sandra...
ECS Transactions. 86 (2018) 7 - p. 233-247 , 2018

Link: https://doi.org/10.1149/..

3

Characterization of 2DEG in AlGaN/GaN heterostructure by Ha..:

Nifa, Iliass ; Leroux, Charles ; Torres, Alphonse...
Microelectronic Engineering. 178 (2017) - p. 128-131 , 2017

Link: https://doi.org/10.1016/..

4

Effects of negative bias stress on trapping properties of A..:

Ferrandis, Philippe ; Charles, Matthew ; Gillot, Charlotte...
Microelectronic Engineering. 178 (2017) - p. 158-163 , 2017

Link: https://doi.org/10.1016/..

5

Study of Ti-Rich and Al-Rich Contact Metallization for AlGa..:

Bertrand, Dimitri ; Fayolle, Murielle ; Torres, Alphonse..
ECS Transactions. 64 (2014) 7 - p. 263-272 , 2014

Link: https://doi.org/10.1149/..

6

XPS Analysis of AlGaN/GaN Surface after Chemical and N-Cont..:

Meunier, Richard ; Torres, Alphonse ; Charles, Matthew...
ECS Transactions. 50 (2013) 3 - p. 451-460 , 2013

Link: https://doi.org/10.1149/..

7

DC and Pulse Characterizations of (600V) 6H-SiC Schottky Di..:

Torres, Alphonse ; Flament, O. ; Musseau, O..
Materials Science Forum. 338-342 (2000) - p. 1215-1218 , 2000

Link: https://doi.org/10.4028/..

8

Effects of negative bias stress on trapping properties of A..:

FERRANDIS, Philippe ; Charles, Matthew ; Gillot, Charlotte...
hal-01987673. , 2017

Link: https://hal.archives-ouv..

9

Effects of negative bias stress on trapping properties of A..:

Ferrandis, Philippe ; Charles, Matthew ; Gillot, Charlotte...
hal-01987673. , 2017

Link: https://hal.science/hal-..

10

Effects of negative bias stress on trapping properties of A..:

Ferrandis, Philippe ; Charles, Matthew ; Gillot, Charlotte...
hal-01987673. , 2017

Link: https://hal.science/hal-..

11

Effects of negative bias stress on trapping properties of A..:

Ferrandis, Philippe ; Charles, Matthew ; Gillot, Charlotte...
hal-01987673. , 2017

Link: https://hal.science/hal-..

12

Effects of negative bias stress on trapping properties of A..:

Ferrandis, Philippe ; Charles, Matthew ; Gillot, Charlotte...
hal-01987673. , 2017

Link: https://hal.science/hal-..

13

Novel C-V measurements based method for the extraction of G..:

Nifa, Iliass ; Leroux, Charles ; Torres, Alphonse...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICMTS.2017.7954287. , 2017

Link: https://hal.science/hal-..

14

High temperature investigation of electron transport proper..:

Nifa, Iliass ; Leroux, Charles ; Torres, Alphonse...
info:eu-repo/grantAgreement/EC/FP7/325630/EU/DEVELOPMENT OF ADVANCED GAN TECHNOLOGIES/AGATE. , 2016

Link: https://hal.science/hal-..

15

AlGaN/GaN MIS-HEMT gate structure improvement using Al2O3 d..:

Meunier, Richard ; Torres, Alphonse ; Charles, Matthew...
info:eu-repo/semantics/altIdentifier/doi/10.1149/05804.0269ecst. , 2013

Link: https://hal.science/hal-..