E-LIB Suche - Ergebnisse für: Tosser, A.J.

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Physica status solidi

Volume 65, Number 1: 16. Mai Physica status solidi ; Volume 65, Number 1, A

Aczel, O. F. G ; Akhmetov, V. D ; Alperovich, V. L... - Reprint 2021 . , [2022]

Link: https://doi.org/10.1515/..

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Physica status solidi

Volume 68, Number 2: December 16 Physica status solidi ; Volume 68, Number 2, A

Amelinckx, S ; Aubet, F . D ; Bach, H. G... - Reprint 2021 . , [2022]

Link: https://doi.org/10.1515/..

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Simple analysis of the Iongitudinal magnetoresistance of th..:

Tijani, H. ; Pichard, C. R. ; Tosser, A. J..
Journal of Materials Science Letters. 6 (1987) 5 - p. 552-554 , 1987

Link: https://doi.org/10.1007/..

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Isotropy of the grain-boundary scattering in the framework ..:

Tijani, H. ; Pichard, C. R. ; Tosser, A. J.
Journal of Materials Science Letters. 6 (1987) 9 - p. 1107-1109 , 1987

Link: https://doi.org/10.1007/..

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Independence of the scattering process at the surface of th..:

Tijani, H. ; Pichard, C. R. ; Tosser, A. J.
Journal of Materials Science Letters. 6 (1987) 5 - p. 555-558 , 1987

Link: https://doi.org/10.1007/..

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Simple analytical expression for the size effect in thin me..:

Tosser, A. J. ; Messaadi, S. ; Pichard, C. R..
Journal of Materials Science Letters. 5 (1986) 11 - p. 1175-1177 , 1986

Link: https://doi.org/10.1007/..

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Effects of ageing procedure on the specular reflection coef..:

Messaadi, S. ; Pichard, C. R. ; Tosser, A. J.
Journal of Materials Science Letters. 5 (1986) 10 - p. 1036-1038 , 1986

Link: https://doi.org/10.1007/..

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Empirical minimization of the number of integrated circuits..:

KHALID-NACIRI, A. ; RABEL, M. ; TOSSER, A.-J.
International Journal of Electronics. 60 (1986) 2 - p. 251-256 , 1986

Link: https://doi.org/10.1080/..

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Simple expression for the characteristic impedance of ridge..:

GUENDOUZ, L. ; MASSAMBA-SITA, H. ; TOSSER, A. J.
International Journal of Electronics. 60 (1986) 2 - p. 185-189 , 1986

Link: https://doi.org/10.1080/..

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Reinterpretation of thickness-dependent conductivity of thi..:

Messaadi, S. ; Pichard, C. ; Tosser, A. J.
Journal of Materials Science Letters. 5 (1986) 9 - p. 873-875 , 1986

Link: https://doi.org/10.1007/..

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Simple calculation of the Hall coefficient of thin metal fi..:

Tosser, A. J. ; Pichard, C. R. ; Lahrichi, M..
Journal of Materials Science Letters. 4 (1985) 5 - p. 585-588 , 1985

Link: https://doi.org/10.1007/..

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Fast analysis of the minimal decision algorithm from non-un..:

KHALID-NACIRI, A. ; BECHAR, H. ; LOTFI, Z..
International Journal of Electronics. 59 (1985) 1 - p. 97-105 , 1985

Link: https://doi.org/10.1080/..

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Procedure for building test sequences for NAND-NOR networks..:

KHALID-NACIRI, A. ; LOTFI, Z. ; TOSSER, A. J.
International Journal of Electronics. 59 (1985) 6 - p. 759-769 , 1985

Link: https://doi.org/10.1080/..

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Fast analysis of MUX synthesis of logical functions from th..:

KHALID-NACIRl, A. ; LOTFI, Z. ; TOSSER, A. J.
International Journal of Electronics. 59 (1985) 3 - p. 333-342 , 1985

Link: https://doi.org/10.1080/..

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Fast and accurate predetermination of the cutoff frequency ..:

GUENDOUZ, L. ; MASSAMBA-SITA, H. ; GAULARD, M.-L..
International Journal of Electronics. 58 (1985) 3 - p. 439-443 , 1985

Link: https://doi.org/10.1080/..