Tougaard, Sven
126  Ergebnisse:
Personensuche X
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3

HAXPES: Inelastic background for characterization of nanost..:

Tougaard, Sven
Surface and Interface Analysis.  56 (2023)  5 - p. 259-266 , 2023
 
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9

Correction to "Determining the Thickness and Completeness o..:

Müller, Anja ; Heinrich, Thomas ; Tougaard, Sven...
The Journal of Physical Chemistry C.  124 (2020)  6 - p. 3923-3923 , 2020
 
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13

Theoretical study toward rationalizing inelastic background..:

Zborowski, Charlotte ; Tougaard, Sven
Surface and Interface Analysis.  51 (2019)  8 - p. 857-873 , 2019
 
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14

Determining the Thickness and Completeness of the Shell of ..:

Müller, Anja ; Heinrich, Thomas ; Tougaard, Sven...
The Journal of Physical Chemistry C.  123 (2019)  49 - p. 29765-29775 , 2019
 
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15

Improved XPS analysis by visual inspection of the survey sp..:

Tougaard, Sven
Surface and Interface Analysis.  50 (2018)  6 - p. 657-666 , 2018
 
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