Tran, Do Phuong Uyen
196  Ergebnisse:
Personensuche X
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Non-contact monitoring of current distribution in a PCB usi..:

, In: 2022 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP),
 
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Discrete Power Semiconductor Losses Versus Junction Tempera..:

Tran, Do Phuong Uyen ; Lefebvre, Stéphane ; Avenas, Yvan
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCPMT.2019.2939617.  , 2020
 
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Discrete Power Semiconductor Losses Versus Junction Tempera..:

Tran, Do Phuong Uyen ; Lefebvre, Stéphane ; Avenas, Yvan
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCPMT.2019.2939617.  , 2020
 
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Discrete Power Semiconductor Losses Versus Junction Tempera..:

Tran, Do Phuong Uyen ; Lefebvre, Stéphane ; Avenas, Yvan
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCPMT.2019.2939617.  , 2020
 
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Discrete Power Semiconductor Losses Versus Junction Tempera..:

Tran, Do Phuong Uyen ; Lefebvre, Stéphane ; Avenas, Yvan
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCPMT.2019.2939617.  , 2020
 
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9

Discrete Power Semiconductor Losses Versus Junction Tempera..:

Tran, Do Phuong Uyen ; Lefebvre, Stéphane ; Avenas, Yvan
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCPMT.2019.2939617.  , 2020
 
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Discrete Power Semiconductor Losses Versus Junction Tempera..:

Tran, Do Phuong Uyen ; Lefebvre, Stéphane ; Avenas, Yvan
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCPMT.2019.2939617.  , 2020
 
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Discrete Power Semiconductor Losses Versus Junction Tempera..:

Tran, Do Phuong Uyen ; Lefebvre, Stéphane ; Avenas, Yvan
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCPMT.2019.2939617.  , 2020
 
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