Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Trivellin, N.
49  Ergebnisse:
Personensuche X
?
1

Early failure of high-power white LEDs for outdoor applicat..:

Caria, A. ; Fraccaroli, R. ; Pierobon, G....
Microelectronics Reliability.  150 (2023)  - p. 115142 , 2023
Link: https://doi.org/10.1016/..
 
?
2

Comparison between Cu(In,Ga)Se2 solar cells with different ..:

Bertoncello, M. ; Barbato, M. ; Caria, A....
Microelectronics Reliability.  138 (2022)  - p. 114612 , 2022
Link: https://doi.org/10.1016/..
 
?
3

Review on the degradation of GaN-based lateral power transi..:

De Santi, C. ; Buffolo, M. ; Rossetto, I....
e-Prime - Advances in Electrical Engineering, Electronics and Energy.  1 (2021)  - p. 100018 , 2021
Link: https://doi.org/10.1016/..
 
?
4

Current induced degradation study on state of the art DUV L..:

Trivellin, N. ; Monti, D. ; De Santi, C....
Microelectronics Reliability.  88-90 (2018)  - p. 868-872 , 2018
Link: https://doi.org/10.1016/..
 
?
5

Thermally-activated degradation of InGaN-based laser diodes..:

De Santi, C. ; Meneghini, M. ; Marioli, M....
Microelectronics Reliability.  54 (2014)  9-10 - p. 2147-2150 , 2014
Link: https://doi.org/10.1016/..
 
?
6

ESD on GaN-based LEDs: An analysis based on dynamic electro..:

Dal Lago, M. ; Meneghini, M. ; De Santi, C....
Microelectronics Reliability.  54 (2014)  9-10 - p. 2138-2141 , 2014
Link: https://doi.org/10.1016/..
 
?
7

Recoverable degradation of blue InGaN-based light emitting ..:

De Santi, C. ; Meneghini, M. ; Trivellin, N....
Applied Physics Letters.  105 (2014)  21 - p. , 2014
Link: https://doi.org/10.1063/..
 
?
8

Degradation of InGaN/GaN laser diodes investigated by micro..:

Meneghini, M. ; Carraro, S. ; Meneghesso, G....
Applied Physics Letters.  103 (2013)  23 - p. , 2013
Link: https://doi.org/10.1063/..
 
?
9

"Hot-plugging" of LED modules: Electrical characterization ..:

Dal Lago, M. ; Meneghini, M. ; Trivellin, N....
Microelectronics Reliability.  53 (2013)  9-11 - p. 1524-1528 , 2013
Link: https://doi.org/10.1016/..
 
?
10

Variations in junction capacitance and doping activation as..:

de Santi, C. ; Meneghini, M. ; Carraro, S....
Microelectronics Reliability.  53 (2013)  9-11 - p. 1534-1537 , 2013
Link: https://doi.org/10.1016/..
 
?
11

Phosphors for LED-based light sources: Thermal properties a..:

Dal Lago, M. ; Meneghini, M. ; Trivellin, N....
Microelectronics Reliability.  52 (2012)  9-10 - p. 2164-2167 , 2012
Link: https://doi.org/10.1016/..
 
?
12

Reliability issues in GaN-based light-emitting diodes: Effe..:

Meneghini, M. ; Dal Lago, M. ; Rodighiero, L....
Microelectronics Reliability.  52 (2012)  8 - p. 1621-1626 , 2012
Link: https://doi.org/10.1016/..
 
?
13

Degradation mechanisms of high-power white LEDs activated b..:

Dal Lago, M. ; Meneghini, M. ; Trivellin, N...
Microelectronics Reliability.  51 (2011)  9-11 - p. 1742-1746 , 2011
Link: https://doi.org/10.1016/..
 
?
14

Degradation of InGaN lasers: Role of non-radiative recombin..:

Trivellin, N. ; Meneghini, M. ; De Santi, C....
Microelectronics Reliability.  51 (2011)  9-11 - p. 1747-1751 , 2011
Link: https://doi.org/10.1016/..
 
?
15

Investigation of the deep level involved in InGaN laser deg..:

Meneghini, M. ; de Santi, C. ; Trivellin, N....
Applied Physics Letters.  99 (2011)  9 - p. , 2011
Link: https://doi.org/10.1063/..
 
1-15