Truffier-Boutry, D.
89  Ergebnisse:
Personensuche X
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1

Bevel contamination management in 3D integration by localiz..:

Boulard, F. ; Gros, V. ; Porzier, C....
Microelectronic Engineering.  265 (2022)  - p. 111875 , 2022
 
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2

Towards the development of safer by design TiO2-based photo..:

Rosset, A. ; Bartolomei, V. ; Laisney, J....
Environmental Science: Nano.  8 (2021)  3 - p. 758-772 , 2021
 
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4

Fluorinated carboxylic membranes deposited by plasma enhanc..:

Thery, J. ; Martin, S. ; Faucheux, V....
Journal of Power Sources.  195 (2010)  17 - p. 5573-5580 , 2010
 
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6

Degradation and surfactant-aided regeneration of fluorinate..:

Zelsmann, M. ; Alleaume, C. ; Truffier-Boutry, D....
Microelectronic Engineering.  87 (2010)  5-8 - p. 1029-1032 , 2010
 
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13

Feasibility of Wafer Exchange for European Edge AI Pilot Li..:

, In: Industrial Artificial Intelligence Technologies and Applications,
 
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