E-LIB Suche - Ergebnisse für: Tsai, Jung-Ruey

1

Physical and electrical properties of induced high-k ZrHfO ..:

Tsai, Jung-Ruey ; Juan, Pi-Chun ; Lin, Cheng-Li.
Japanese Journal of Applied Physics. 56 (2016) 1S - p. 01AD02 , 2016

Link: https://doi.org/10.7567/..

2

Characteristics of metal-gate metal-insulator-semiconductor..:

Tsai, Jung-Ruey ; Juan, Pi-Chun ; Chen, Po-Jen
Thin Solid Films. 618 (2016) - p. 55-59 , 2016

Link: https://doi.org/10.1016/..

3

Impact of gate dielectrics and oxygen annealing on tin-oxid..:

Zhong, Chia-Wen ; Lin, Horng-Chih ; Tsai, Jung-Ruey..
Japanese Journal of Applied Physics. 55 (2016) 4S - p. 04EG02 , 2016

Link: https://doi.org/10.7567/..

4

Nitrogen ratio and RTA optimization on sputtered TiN/SiO2/S..:

Ren, Chang ; Yang, Chia-Ming ; Lyu, Chengang...
Vacuum. 118 (2015) - p. 113-117 , 2015

Link: https://doi.org/10.1016/..

5

Structural and optical properties of zirconia thin films de..:

Zhao, Xiaoli ; Jin, Jie ; Cheng, Jui-Ching...
Thin Solid Films. 570 (2014) - p. 404-411 , 2014

Link: https://doi.org/10.1016/..

6

Optimization of electrical properties of Al/LaAlO3/indium t..:

Tsai, Jung-Ruey ; Feng, Wen-Sheng ; Chien, Po-Hsiu.
Thin Solid Films. 555 (2014) - p. 153-158 , 2014

Link: https://doi.org/10.1016/..

7

Gate-all-around floating-gate memory device with triangular..:

Tsai, Jung-Ruey ; Lee, Ko-Hui ; Lin, Horng-Chih.
Japanese Journal of Applied Physics. 53 (2014) 4S - p. 04ED14 , 2014

Link: https://doi.org/10.7567/..

8

Effect of implantation damage on transient loss of phosphor..:

Chang, Ruey-Dar ; Tsai, Jung-Ruey
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 313 (2013) - p. 1-4 , 2013

Link: https://doi.org/10.1016/..

9

Low-voltage high-speed programming/erasing floating-gate me..:

Lee, Ko-Hui ; Tsai, Jung-Ruey ; Chang, Ruey-Dar..
Applied Physics Letters. 103 (2013) 15 - p. , 2013

Link: https://doi.org/10.1063/..

10

Effect of Finger and Device-Width on Ruggedness of nLDMOS D..:

Agarwal, Neelam ; Sharma, Karuna N. ; Tsai, Jung-Ruey...
ECS Transactions. 44 (2012) 1 - p. 1123-1130 , 2012

Link: https://doi.org/10.1149/..

11

Modeling of phosphorus deactivation in polysilicon for simu..:

Chang, Ruey-Dar ; Lin, Chih-Hung ; Ma, Chia-Chi.
Solid-State Electronics. 75 (2012) - p. 16-21 , 2012

Link: https://doi.org/10.1016/..

12

Optimization of nLDMOS Ruggedness under Unclamped Inductive..:

Agarwal, Neelam ; Sharma, Karuna N. ; Tsai, Jung-Ruey..
ECS Transactions. 44 (2012) 1 - p. 127-133 , 2012

Link: https://doi.org/10.1149/..

13

A New Methodology to Investigate the Effect of Stress and B..:

Kumar, Manoj ; Sheu, Gene ; Tsai, Jung-Ruey..
ECS Transactions. 44 (2012) 1 - p. 1285-1289 , 2012

Link: https://doi.org/10.1149/..

14

Defect passivation by O2 plasma treatment on high-k dielect..:

Liu, Kou-Chen ; Tsai, Jung-Ruey ; Lin, Wen-Kai..
Thin Solid Films. 519 (2011) 15 - p. 5110-5113 , 2011

Link: https://doi.org/10.1016/..

15

Investigation of SiOxCy film as the encapsulation layer for..:

Liu, Kou-Chen ; Cheng, Hsiang-Ling ; Tsai, Jung-Ruey...
Thin Solid Films. 518 (2010) 22 - p. 6195-6198 , 2010

Link: https://doi.org/10.1016/..