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2022 International Electron Devices Meeting (IEDM) ,
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Design and Characterization of the Junction Isolation Struc..:
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2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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Device isolation process for 4H-SiC CMOS ICs:
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2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
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Dual Gate Oxide CMOS Process on 4H-SiC:
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2023 IEEE International Conference on Bioinformatics and Biomedicine (BIBM) ,
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