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2023 IEEE International Reliability Physics Symposium (IRPS) ,
2
A Novel Data Recovery Technique for 3D TLC NAND Flash Memor..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
4
First Observation of Ultra-high Polarization (~ 108 μC/cm²)..:
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2023 International Electron Devices Meeting (IEDM) ,
7
A Target-Read Retry Scheme for 3D Charge Trap NAND Flash Me..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
10
The Field-dependence Endurance Model and Its Mutual Effect ..:
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2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
11
CeO2-Doped Hf0.5Zr0.5O2 Ferroelectrics for High Endurance E..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
14