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Tu, Honyih
13  Ergebnisse:
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1

Random Telegraph Noise Degradation Caused by Hot Carrier In..:

Chao, Calvin Yi-Ping ; Wu, Thomas Meng-Hsiu ; Yeh, Shang-Fu...
Sensors.  23 (2023)  18 - p. 7959 , 2023
Link: https://doi.org/10.3390/..
 
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2

Statistical Analysis of Random Telegraph Noises of MOSFET S..:

Chao, Calvin Yi-Ping ; Wu, Meng-Hsu ; Yeh, Shang-Fu...
IEEE Journal of the Electron Devices Society.  9 (2021)  - p. 972-984 , 2021
Link: https://doi.org/10.1109/..
 
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3

Random Telegraph Noises from the Source Follower, the Photo..:

Chao, Calvin Yi-Ping ; Yeh, Shang-Fu ; Wu, Meng-Hsu...
Sensors.  19 (2019)  24 - p. 5447 , 2019
Link: https://doi.org/10.3390/..
 
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4

Statistical Analysis of the Random Telegraph Noise in a 1.1..:

Chao, Calvin ; Tu, Honyih ; Wu, Thomas...
Sensors.  17 (2017)  12 - p. 2704 , 2017
Link: https://doi.org/10.3390/..
 
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5

Random Telegraph Noise Degradation Caused by Hot Carrier In..:

Chao, Calvin Yi-Ping ; Wu, Thomas Meng-Hsiu ; Yeh, Shang-Fu...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10535337/.  , 2023
Link: http://www.ncbi.nlm.nih...
 
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6

Statistical Analysis of the Random Telegraph Noise in a 1.1..:

Chao, Calvin Yi-Ping ; Tu, Honyih ; Wu, Thomas Meng-Hsiu...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC5751670/.  , 2017
Link: http://www.ncbi.nlm.nih...
 
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7

Random Telegraph Noise Degradation Caused by Hot Carrier In..:

Calvin Yi-Ping Chao ; Thomas Meng-Hsiu Wu ; Shang-Fu Yeh...
https://www.mdpi.com/1424-8220/23/18/7959.  , 2023
Link: https://doi.org/10.3390/..
 
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8

Statistical Analysis of Random Telegraph Noises of MOSFET S..:

Calvin Yi-Ping Chao ; Meng-Hsu Wu ; Shang-Fu Yeh...
https://ieeexplore.ieee.org/document/9577145/.  , 2021
Link: https://doi.org/10.1109/..
 
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9

Random Telegraph Noises in CMOS Image Sensors Caused by Var..:

Calvin Yi-Ping Chao ; Thomas M.-H. Wu ; Shang-Fu Yeh...
https://ieeexplore.ieee.org/document/8612927/.  , 2019
Link: https://doi.org/10.1109/..
 
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10

Random Telegraph Noises from the Source Follower, the Photo..:

Calvin Yi-Ping Chao ; Shang-Fu Yeh ; Meng-Hsu Wu...
https://dx.doi.org/10.3390/s19245447.  , 2019
Link: https://doi.org/10.3390/..
 
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11

CMOS Image Sensor Random Telegraph Noise Time Constant Extr..:

Calvin Yi-Ping Chao ; Honyih Tu ; Thomas Wu...
https://ieeexplore.ieee.org/document/7731134/.  , 2017
Link: https://doi.org/10.1109/..
 
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12

Statistical Analysis of the Random Telegraph Noise in a 1.1..:

Calvin Yi-Ping Chao ; Honyih Tu ; Thomas Meng-Hsiu Wu...
https://www.mdpi.com/1424-8220/17/12/2704.  , 2017
Link: https://doi.org/10.3390/..
 
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13

Statistical Analysis of the Random Telegraph Noise in a 1.1..:

Calvin Chao ; Honyih Tu ; Thomas Wu...
https://dx.doi.org/10.3390/s17122704.  , 2017
Link: https://doi.org/10.3390/..
 
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