Tun, Naing Min
243  Ergebnisse:
Personensuche X
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1

Multi-Classification of Satellite Imagery Using Fully Convo..:

, In: 2020 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM),
 
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2

Face Identification System using Deep Learning Method at Lo..:

, In: 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus),
 
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3

Facial Image Denoising Using Convolutional Autoencoder Netw..:

, In: 2020 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM),
 
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4

Human Face Recognition Using Combination of ZCA Feature Ext..:

, In: 2019 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM),
 
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5

Dispersion of carbon nanomaterials in an aqueous medium usi..:

Van Nguyen, Hoo ; Tun, Naing Min ; Rakov, E. G.
Russian Journal of Inorganic Chemistry.  60 (2015)  4 - p. 536-540 , 2015
 
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7

Dependence of the "solubility" of oxidized carbon nanomater..:

Nguyen, Hoo Van ; Tun, Naing Min ; Kryukov, A. Yu...
Russian Journal of Physical Chemistry A.  88 (2014)  9 - p. 1559-1563 , 2014
 
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9

Design, fabrication and measurement of metal-semiconductor ..:

Tun, Hla Myo ; Wulansari, Rizky Ema ; Pradhan, Devasis.
Journal of Engineering Researcher and Lecturer.  2 (2023)  3 - p. 104-111 , 2023
 
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10

Design, Analysis and Fabrication of Dual Band Microstrip Pa..:

, In: 2022 International Conference for Advancement in Technology (ICONAT),
Oo, Wai Mar ; Tun, Hla Myo ; Nway, Tint May... - p. 1-5 , 2022
 
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11

Research on Self-balancing Two Wheels Mobile Robot Control ..:

Tun, Hla Myo ; Nwe, Myat Su ; Naing, Zaw Min...
Electrical Science & Engineering.  4 (2022)  1 - p. 7-20 , 2022
 
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12

Measurement Analysis of Specific Absorption Rate in Human B..:

Tun, Hla Myo ; Kyu Win, Khin Kyu ; Naing, Zaw Min..
Semiconductor Science and Information Devices.  3 (2021)  2 - p. 17-26 , 2021
 
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15

Development of process monitoring system in drilling proces..:

Tun, Hla Myo ; Kyaw, Marlar ; Naing, Zaw Min
International Journal of System Assurance Engineering and Management.  2 (2011)  1 - p. 78-83 , 2011
 
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